UCC28720

SLUSBE8 – MAY 2013

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE

PINS

ORDERABLE

DEVICES

SOIC (D)

7

UCC28720D

(1)

See Orderable Addendum for specific device ordering information.

(2)

For other fixed cable compensation options, please consult the factory.

ABSOLUTE MAXIMUM RATINGS

(1)

MIN

MAX

UNIT

Start-up pin voltage, HV

700

V

Bias supply voltage, VDD

38

Continuous base current sink

50

Continuous base current source

Self- limiting

mA

Peak current, VS

−1.2

Base drive voltage at DRV

−0.5

Self- limiting

VS

−0.75

7

V

Voltage range

CS, CBC

−0.5

5

Operating junction temperature range

−55

150

Storage temperature

−65

150

°C

Lead temperature 0.6 mm from case for 10 seconds

260

Human-body model (HBM)

2000

ESD rating

V

Charged-device model (CDM)

500

(1)

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. Exposure to absolute-

maximum-rated conditions for extended periods may affect device reliability. These are stress ratings only and functional operation of

the device at these or any other conditions beyond those indicated under “Recommended Operating Conditions” is not implied.

Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. All voltages are with respect

to GND. Currents are positive into, negative out of the specified terminal. These ratings apply over the operating ambient temperature

ranges unless otherwise noted.

2

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