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HSMS-281E Datasheet(PDF) 3 Page - AVAGO TECHNOLOGIES LIMITED |
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HSMS-281E Datasheet(HTML) 3 Page - AVAGO TECHNOLOGIES LIMITED |
3 / 10 page 3 Quad Capacitance Capacitance of Schottky diode quads is measured using an HP4271 LCR meter. This instrument effectively isolates individual diode branches from the others, allowing ac‑ curate capacitance measurement of each branch or each diode. The conditions are: 20 mV R.M.S. voltage at 1 MHz. Avago defines this measurement as “CM”, and it is equiva‑ lent to the capacitance of the diode by itself. The equiva‑ lent diagonal and adjacent capaci‑tances can then be cal‑ culated by the formulas given below. In a quad, the diagonal capacitance is the capacitance be‑ tween points A and B as shown in the figure below. The diagonal capacitance is calculated using the following formula Cj Rj RS Rj = 8.33 X 10-5 nT Ib + Is where Ib = externally applied bias current in amps Is = saturation current (see table of SPICE parameters) T = temperature, °K n = ideality factor (see table of SPICE parameters) Note: To effectively model the packaged HSMS-281x product, please refer to Application Note AN1124. RS = series resistance (see Table of SPICE parameters) Cj = junction capacitance (see Table of SPICE parameters) Linear Equivalent Circuit Model Diode Chip ESD WARNING: Handling Precautions Should Be Taken To Avoid Static Discharge. SPICE Parameters Parameter Units HSMS-281x BV V 25 CJ0 pF 1.1 EG eV 0.69 IBV A E‑5 IS A 4.8E‑9 N 1.08 RS Ω 10 PB V 0.65 PT 2 M 0.5 C1 x C 2 C3 x C 4 CDIAGONAL = _______ + _______ C1 + C 2 C 3 + C 4 1 CADJACENT = C 1 + ____________ 1 1 1 –– + –– + –– C 2 C3 C4 R j = 8.33 X 10 -5 nT I b + I s C1 x C 2 C3 x C 4 CDIAGONAL = _______ + _______ C1 + C 2 C 3 + C 4 1 CADJACENT = C 1 + ____________ 1 1 1 –– + –– + –– C 2 C3 C4 R j = 8.33 X 10 -5 nT I b + I s The equivalent adjacent capacitance is the capacitance between points A and C in the figure below. This capaci‑ tance is calculated using the following formula This information does not apply to cross‑over quad di‑ odes. |
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