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6N134-883B Datasheet(PDF) 11 Page - AVAGO TECHNOLOGIES LIMITED |
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6N134-883B Datasheet(HTML) 11 Page - AVAGO TECHNOLOGIES LIMITED |
11 / 12 page 11 Figure 10. Operating Circuit for Burn-In and Steady State Life Tests. Figure 8. Test Circuit for t EHL and tELH. Figure 9. Enable Propagation Delay vs. Temperature. GND VCC +5 V D.U.T. IF = 13 mA PULSE GENERATOR ZO = 50 Ω tr = 5 ns CL* RL * CL INCLUDES PROBE AND STRAY WIRING CAPACITANCE. VE VOUT OUTPUT VE MONITORING NODE OUTPUT VO MONITORING NODE 0.01 μF BYPASS GND VCC D.U.T.* TA = +125 oC * ALL CHANNELS TESTED SIMULTANEOUSLY. VOC CONDITIONS: IF = 20 mA VCC VIN +- (EACH OUTPUT) (EACH INPUT) IO = 25 mA 0.01 μF 200 Ω 5.3 V (EACH OUTPUT) +5.5 V +5.5 V 200 Ω |
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