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5962-89637 Datasheet(PDF) 8 Page - List of Unclassifed Manufacturers

Part No. 5962-89637
Description  MICROCIRCUIT, LINEAR, WIDEBAND RMS-TO-DC CONVERTER, MONOLITHIC SILICON
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5962-89637 Datasheet(HTML) 8 Page - List of Unclassifed Manufacturers

 
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STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-89637
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
8
DSCC FORM 2234
APR 97
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements
Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
Interim electrical parameters
(method 5004)
1
Final electrical test parameters
(method 5004)
1*, 2, 3
Group A test requirements
(method 5005)
1, 2, 3, 4**
Groups C and D end-point
electrical parameters
(method 5005)
1
* PDA applies to subgroup 1.
** Subgroups 4, if not tested shall be guaranteed to the limits specified in table I herein.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
Subgroups 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.3.2 Groups C and D inspections.
a.
End-point electrical parameters shall be as specified in table II herein.
b.
Steady-state life test conditions, method 1005 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test
method 1005 of MIL-STD-883.
(2)
TA = +125
°C, minimum.
(3)
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.


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