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RC2012J000CS Datasheet(PDF) 8 Page - Samsung semiconductor

Part No. RC2012J000CS
Description  Thick Film Chip Resistor ( General )
Download  19 Pages
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Maker  SAMSUNG [Samsung semiconductor]
Homepage  http://www.samsung.com/Products/Semiconductor
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RC2012J000CS Datasheet(HTML) 8 Page - Samsung semiconductor

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ENVIRONMENTAL CHARACTERISTIC
The Environmental characteristic test should satisfy the test method, procedure, and standard.
If there is no special comment, Each test performs in standard state.
(temperature 20℃, humidity 65%RH, pressure 1023mbar)
item
Permissible deviation
Test method
Resistor
Jumper
Termination
strength
묤 No mechanical
damage, or sign of
disconnection
Same as
left
묤 Standard : JIS C 5201-1 4.16
묤 Test time : applying pressure for 10 seconds
묤 Test tension : 0603,1005,1608 - 3N (300g묤f)
Others (500g묤f)
Withstanding
soldering heat
1. No mechanical
damage
2. ΔR should be
within ±(1%+0.05Ω)
50mΩ
Maximum
묤 Standard : JIS C 5201-1 4.18
묤 Temperature : 260 ± 5℃
묤 Test time : 10 ± 1second (both side dipping)
묤 Test procedure : measures after 24 hours
Vibration
1. No mechanical
damage
2. ΔR should be
within ±(1%+0.05Ω)
50mΩ
Maximum
묤 Standard : JIS C 5201-1 4.22
묤 Test amplitude : 1.5mm
묤 Test procedure : frequency 10Hz - 55Hz -
10Hz each 2 hours in x, y, z direction.
item
Permissible deviation
Test method
Resistor
Jumper
Temperature
cycle
1. No mechanical
damage
2. ΔR should be
within ±(1%+0.1Ω)
50mΩ
Maximum
Standard : JIS C 5201-1 4.19
Test procedure : <Table 11>
Measure : after 100 cycles of procedure
Test board : <Fig 11>
Moisture
resistance life
1. No mechanical
damage
2. ΔR should be
within <Table 12>
50mΩ
Maximum
Standard : JIS C 5201-1 4.14
Test condition : temp 40 ± 3℃, humid 90 ~
95%RH
Test voltage : rated voltage
Test time : repeat 90min ON, 30min OFF
during 1000+48 hours
Test board : <Fig 11>
item
1
2
3
4
tem p(℃)
-55± 2
5~35
125±2
5~35
tim e(m in)
30
15
30
15
<Table 11>
<Table 12>
Range( Ω)
ΔRMAX
1≤ R < 10
±
5%
10 ≤ R < 1M
±(3 %+0.1Ω)
1M ≤ R < 10M
±
5%


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