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RC2012J000CS Datasheet(PDF) 6 Page - Samsung semiconductor

Part No. RC2012J000CS
Description  Thick Film Chip Resistor ( General )
Download  19 Pages
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Maker  SAMSUNG [Samsung semiconductor]
Homepage  http://www.samsung.com/Products/Semiconductor
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RC2012J000CS Datasheet(HTML) 6 Page - Samsung semiconductor

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RELIABILITY TEST CONDITION
Jumper's reliability test data are only applied to General type resistor.
ELECTRICAL CHARACTERISTIC
The electrical characteristic test should satisfy the test method, procedure, and standard.
If there is no special comment, Each test performs in standard state.
(temperature 20℃, humidity 65%RH, pressure 1023mbar)
item
Permissible deviation
Test method
Resistor
Jumper
DC resistance
DC resistance value
should be within the
specified resistance
tolerance.
50mΩ
Maximum
Standard : JIS C 5201-1 4.5
Test voltage : <Table 8>
Applying time : within 5 seconds.
Test board : <Fig 11>
Temperature
Coefficient
of
Resistance
-
Standard : JIS C 5201-1 4.8
Temp. : 20℃→ -55℃→ 20℃→ 125℃→
20℃
Test board : <Fig 13>
Calculation :
TCR(ppm/℃)=
T0 :20 ± 2℃
R0 :Resistance atT0 (Ω)
T : Test temperature ( -55, 125℃)
R : Resistance at T (Ω)
Short time
overload
(STOL)
1. No mechanical
damage
2. ΔR should be
within ±(1%+0.1Ω)
50mΩ
Maximum
Standard : JIS C 5201-1 4.13
Test voltage : 2.5 times of rated voltage Max.
surge current at the Jumper.
Applying time : 5 seconds
Test board : <Fig 12>
Intermittent
overload
(IOL)
1. No mechanical
damage
2. ΔR should be
within ±(3%+0.1Ω)
50mΩ
Maximum
Standard : JIS C 5201-1 4.13
Test voltage : 2.5 times of rated voltage Max.
surge current at the Jumper.
Test method : 1 sec ON, 25 sec OFF
10,000
+40 0cycles
Test board : <Fig 12>
<Table 8>
Range (Ω)
Voltage (V)
1≤ R < 10
0.1
10 ≤ R < 100
0.3
100 ≤ R < 1K
1.0
1K ≤ R < 10K
3.0
10K ≤ R < 100K
10.0
100K ≤ R < 1M
25.0
1M ≤ R < 10M
30.0
Range(Ω)
ppm/℃
1≤ R < 10
±
500
10 ≤ R < 1M
±
200
0603:±250
1M ≤ R < 10M
±
300
RR
RT T
×
×
0
00
6
1
10
<Table 9>


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