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THS1030CDWRG4 Datasheet(PDF) 5 Page - Texas Instruments |
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THS1030CDWRG4 Datasheet(HTML) 5 Page - Texas Instruments |
5 / 39 page THS1030 3V TO 5.5V, 10BIT, 30 MSPS CMOS ANALOGTODIGITAL CONVERTER SLAS243E − NOVEMBER 1999 − REVISED DECEMBER 2003 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics over recommended operating conditions, AVDD = 3 V, DVDD = 3 V, fs = 30 MSPS/50% duty cycle, MODE = AVDD, 2-V input span from 0.5 V to 2.5 V, external reference, TA = Tmin to Tmax (unless otherwise noted) (continued) dc accuracy PARAMETER MIN TYP MAX UNIT INL Integral nonlinearity (see Note 2) ±1 ±2 LSB DNL Differential nonlinearity (see Note 3) ±0.3 ±1 LSB Offset error (see Note 4) 0.4 1.4 %FSR Gain error (see Note 5) 1.4 3.5 %FSR Missing code No missing code assured NOTES: 2. Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero to full scale. The point used as zero occurs 1/2 LSB before the first code transition. The full-scale point is defined as a level 1/2 LSB beyond the last code transition. The deviation is measured from the center of each particular code to the true straight line between these two endpoints. 3. An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. Therefore this measure indicates how uniform the transfer function step sizes are. The ideal step size is defined here as the step size for the device under test (i.e., (last transition level – first transition level) ÷ (2 n – 2)). Using this definition for DNL separates the effects of gain and offset error. A minimum DNL better than –1 LSB ensures no missing codes. 4. Offset error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that will switch the ADC output from code 0 to code 1. The ideal voltage level is determined by adding the voltage corresponding to 1/2 LSB to the bottom reference level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references divided by the number of ADC output levels (1024). 5. Gain error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that will switch the ADC output from code 1022 to code 1023. The ideal voltage level is determined by subtracting the voltage corresponding to 1.5 LSB from the top reference level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references divided by the number of ADC output levels (1024). dynamic performance (See Note 6) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT f = 3.5 MHz 8.4 9 ENOB Effective number of bits f = 3.5 MHz, AVDD = 5 V 9 Bits ENOB Effective number of bits f = 15 MHz, 3 V 7.8 Bits f = 15 MHz, AVDD = 5 V 7.7 f = 3.5 MHz 56 60.6 SFDR Spurious free dynamic range f = 3.5 MHz, AVDD = 5 V 64.6 dB SFDR Spurious free dynamic range f = 15 MHz 48.5 dB f = 15 MHz, AVDD = 5 V 53 f = 3.5 MHz −60 −56 dB THD Total harmonic distortion f = 3.5 MHz, AVDD = 5 V − 66.9 dB THD Total harmonic distortion f = 15 MHz − 47.5 f = 15 MHz, AVDD = 5 V − 53.1 f = 3.5 MHz 53 57 dB SNR Signal-to-noise ratio f = 3.5 MHz, AVDD = 5 V 56 dB SNR Signal-to-noise ratio f = 15 MHz 53.1 f = 15 MHz, AVDD = 5 V 49.4 f = 3.5 MHz 52.5 56 SINAD Signal-to-noise and distortion f = 3.5 MHz, AVDD = 5 V 56 dB SINAD Signal-to-noise and distortion f = 15 MHz 48.6 dB f = 15 MHz, AVDD = 5 V 48.1 NOTES: 6. Input amplitude of single tone sine wave for dynamic tests is −0.5 dBFS. |
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