SN54HC08-DIE

www.ti.com

SCLS734 – JUNE 2013

RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-AND GATES

Check for Samples: SN54HC08-DIE

1

FEATURES

•

Wide Operating Voltage Range

•

Outputs Can Drive Up To 10 LSTTL Loads

•

Low Power Consumption

•

•

Low Input Current

DESCRIPTION

The SN54HC08-DIE device contains four independent 2-input AND gates. Each gate performs the Boolean

function of Y = A • B or Y = A + B in positive logic.

PACKAGE

PRODUCT

PACKAGE

ORDERABLE PART NUMBER

PACKAGE QUANTITY

DESIGNATOR

SN54HC08VTDF1

100

SN54HC08V

TD

SN54HC08VTDF2

10

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control

System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature

only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual

Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

On products compliant to MIL-PRF-38535, all parameters are

Instruments standard warranty. Production processing does not

tested unless otherwise noted. On all other products, production

necessarily include testing of all parameters.

processing does not necessarily include testing of all parameters.