VS-GB70NA60UF

www.vishay.com

Vishay Semiconductors

Revision: 01-Feb-12

6

Document Number: 93103

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT

Fig. 16 - Clamped Inductive Load Test Circuit

Fig. 17 - Pulsed Collector Current Test Circuit

Fig. 18 - Switching Loss Test Circuit

0.001

0.1

0.01

1

0.00001

0.0001

0.001

0.01

0.1

100

10

1

D = 0.50

D = 0.20

D = 0.10

D = 0.05

D = 0.02

D = 0.01

DC

* Driver same type as D.U.T.; V

* Note: Due to the 50 V power supply, pulse width and inductor

will increase to obtain Id

50 V

1000 V

D.U.T.

L

V

2

1

R

g

V

CC

D.U.T.

R =

V

CC

+

-

L

Diode clamp/

D.U.T.

D.U.T./

driver

- 5 V

+

-

R

g

V

CC

+

-