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STM32F405OE Datasheet(PDF) 96 Page - STMicroelectronics

Part No. STM32F405OE
Description  ARM Cortex-M4 32b MCUFPU, 210DMIPS, up to 1MB Flash/1924KB RAM, USB OTG HS/FS
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F405OE Datasheet(HTML) 96 Page - STMicroelectronics

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Electrical characteristics
STM32F405xx, STM32F407xx
96/185
DocID022152 Rev 4
5.3.8
External clock source characteristics
High-speed external user clock generated from an external source
The characteristics given in Table 29 result from tests performed using an high-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 14.
Low-speed external user clock generated from an external source
The characteristics given in Table 30 result from tests performed using an low-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 14.
Table 29. High-speed external user clock characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
fHSE_ext
External user clock source
frequency(1)
1-
50
MHz
VHSEH
OSC_IN input pin high level voltage
0.7VDD
-VDD
V
VHSEL
OSC_IN input pin low level voltage
VSS
-0.3VDD
tw(HSE)
tw(HSE)
OSC_IN high or low time(1)
1. Guaranteed by design, not tested in production.
5-
-
ns
tr(HSE)
tf(HSE)
OSC_IN rise or fall time(1)
--
10
Cin(HSE) OSC_IN input capacitance(1)
-5
-
pF
DuCy(HSE) Duty cycle
45
-
55
%
IL
OSC_IN Input leakage current
VSS ≤ VIN ≤ VDD
--
±1
µA
Table 30. Low-speed external user clock characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
fLSE_ext
User External clock source
frequency(1)
-
32.768
1000
kHz
VLSEH
OSC32_IN input pin high level
voltage
0.7VDD
-VDD
V
VLSEL
OSC32_IN input pin low level voltage
VSS
-0.3VDD
tw(LSE)
tf(LSE)
OSC32_IN high or low time(1)
450
-
-
ns
tr(LSE)
tf(LSE)
OSC32_IN rise or fall time(1)
--
50
Cin(LSE)
OSC32_IN input capacitance(1)
-5
-
pF
DuCy(LSE) Duty cycle
30
-
70
%
IL
OSC32_IN Input leakage current
VSS ≤ VIN ≤ VDD
--
±1
µA
1. Guaranteed by design, not tested in production.


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