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74ABT16952 Datasheet(PDF) 3 Page - Fairchild Semiconductor

Part No. 74ABT16952
Description  16-Bit Registered Transceiver with 3-STATE Outputs
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Maker  FAIRCHILD [Fairchild Semiconductor]
Homepage  http://www.fairchildsemi.com
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74ABT16952 Datasheet(HTML) 3 Page - Fairchild Semiconductor

   
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Absolute Maximum Ratings(Note 1)
Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Note 3: For 8-bit toggling, ICCD <1.4 mA/MHz.
Note 4: Guaranteed, but not tested.
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Junction Temperature under Bias
−55°C to +150°C
VCC Pin Potential to Ground Pin
−0.5V to +7.0V
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Any Output
in the Disable or Power-Off State
−0.5V to +5.5V
in the HIGH State
−0.5V to V
CC
Current Applied to Output
in LOW State (Max)
twice the rated IOL (mA)
DC Latchup Source Current
−500 mA
Over Voltage Latchup (I/O)
10V
Free Air Ambient Temperature
−40°C to +85°C
Supply Voltage
+4.5V to +5.5V
Minimum Input Edge Rate (
∆V/∆t)
Data Input
50 mV/ns
Enable Input
20 mV/ns
Clock Input
100 mV/ns
Symbol
Parameter
Min
Typ
Max
Units
VCC
Conditions
VIH
Input HIGH Voltage
2.0
V
Recognized HIGH Signal
VIL
Input LOW Voltage
0.8
V
Recognized LOW Signal
VCD
Input Clamp Diode Voltage
−1.2
V
Min
IIN = −18 mA (Non I/O Pins)
VOH
Output HIGH Voltage
2.5
VMin
IOH = −3 mA (An, Bn)
2.0
IOH = −32 mA (An, Bn)
VOL
Output LOW Voltage
0.55
V
Min
IOL = 64 mA (An, Bn)
VID
Input Leakage Test
4.75
V
0.0
IID = 1.9 µA (Non-I/O Pins)
All Other Pins Grounded
IIH
Input HIGH Current
1
µA
Max
VIN = 2.7V (Non-I/O Pins) (Note 4)
1VIN = VCC (Non-I/O Pins)
IBVI
Input HIGH Current Breakdown Test
7
µA
Max
VIN = 7.0V (Non-I/O Pins)
IBVIT
Input HIGH Current Breakdown Test (I/O)
100
µA
Max
VIN = 5.5V (An, Bn)
IIL
Input LOW Current
−1
µA
Max
VIN = 0.5V (Non-I/O Pins) (Note 4)
−1V
IN = 0.0V (Non-I/O Pins)
IIH + IOZH
Output Leakage Current
10
µA
0V–5.5V VOUT = 2.7V (An, Bn);
OEA or OEB
= 2.0V
IIL + IOZL
Output Leakage Current
−10
µA
0V–5.5V VOUT = 0.5V (An, Bn);
OEA or OEB
= 2.0V
IOS
Output Short-Circuit Current
−100
−275
mA
Max
VOUT = 0V (An, Bn)
ICEX
Output HIGH Leakage Current
50
µA
Max
VOUT = VCC (An, Bn)
IZZ
Bus Drainage Test
100
µA
0.0V
VOUT = 5.5V (An, Bn);
All Others GND
ICCH
Power Supply Current
1.0
mA
Max
All Outputs HIGH
ICCL
Power Supply Current
60
mA
Max
All Outputs LOW
ICCZ
Power Supply Current
1.0
mA
Max
Outputs 3-STATE;
All Others GND
ICCT
Additional ICC/Input
2.5
mA
Max
VI = VCC − 2.1V; All Others
at VCC or GND
ICCD
Dynamic ICC
No Load
mA/
Max
Outputs OPEN
(Note 4)
0.18
MHz
OEA or OEB
= GND,
Non-I/O
= GND or V
CC
One Bit toggling, 50% duty cycle
(Note 3)


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