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06031A120FAT2A Datasheet(PDF) 2 Page - AVX Corporation

Part No. 06031A120FAT2A
Description  C0G (NP0) Dielectric
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Maker  AVX [AVX Corporation]
Homepage  http://www.avx.com
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06031A120FAT2A Datasheet(HTML) 2 Page - AVX Corporation

   
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5
C0G (NP0) Dielectric
Specifications and Test Methods
Parameter/Test
NP0 Specification Limits
Measuring Conditions
Operating Temperature Range
-55ºC to +125ºC
Temperature Cycle Chamber
Capacitance
Within specified tolerance
Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
Q
<30 pF: Q≥ 400+20 x Cap Value
1.0 kHz ± 10% for cap > 1000 pF
≥30 pF: Q≥ 1000
Voltage: 1.0Vrms ± .2V
Insulation Resistance
100,000MΩ or 1000MΩ - μF,
Charge device with rated voltage for
whichever is less
60 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
Dielectric Strength
No breakdown or visual defects
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Appearance
No defects
Deflection: 2mm
Capacitance
Test Time: 30 seconds
Resistance to
Variation
±5% or ±.5 pF, whichever is greater
Flexure
Q
Meets Initial Values (As Above)
Stresses
Insulation
≥ Initial Value x 0.3
Resistance
Solderability
≥ 95% of each terminal should be covered
Dip device in eutectic solder at 230 ± 5ºC
with fresh solder
for 5.0 ± 0.5 seconds
Appearance
No defects, <25% leaching of either end terminal
Capacitance
Variation
≤ ±2.5% or ±.25 pF, whichever is greater
Dip device in eutectic solder at 260ºC for 60
Q
Meets Initial Values (As Above)
seconds. Store at room temperature for 24 ± 2
Resistance to
hours before measuring electrical properties.
Solder Heat
Insulation
Meets Initial Values (As Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Appearance
No visual defects
Step 1: -55ºC ± 2º
30 ± 3 minutes
Capacitance
Variation
≤ ±2.5% or ±.25 pF, whichever is greater
Step 2: Room Temp
≤ 3 minutes
Q
Meets Initial Values (As Above)
Step 3: +125ºC ± 2º
30 ± 3 minutes
Thermal
Shock
Insulation
Meets Initial Values (As Above)
Step 4: Room Temp
≤ 3 minutes
Resistance
Dielectric
Meets Initial Values (As Above)
Repeat for 5 cycles and measure after
Strength
24 hours at room temperature
Appearance
No visual defects
Capacitance
Variation
≤ ±3.0% or ± .3 pF, whichever is greater
Charge device with twice rated voltage in
≥ 30 pF:
Q≥ 350
test chamber set at 125ºC ± 2ºC
Load Life
Q
≥10 pF, <30 pF:
Q≥ 275 +5C/2
for 1000 hours (+48, -0).
(C=Nominal Cap)
<10 pF:
Q≥ 200 +10C
Insulation
≥ Initial Value x 0.3 (See Above)
Remove from test chamber and stabilize at
Resistance
room temperature for 24 hours
Dielectric
Meets Initial Values (As Above)
before measuring.
Strength
Appearance
No visual defects
Capacitance
Variation
≤ ±5.0% or ± .5 pF, whichever is greater
Store in a test chamber set at 85ºC ± 2ºC/
≥ 30 pF:
Q≥ 350
85% ± 5% relative humidity for 1000 hours
Load
Q
≥10 pF, <30 pF:
Q≥ 275 +5C/2
(+48, -0) with rated voltage applied.
Humidity
<10 pF:
Q≥ 200 +10C
Insulation
≥ Initial Value x 0.3 (See Above)
Remove from chamber and stabilize at
Resistance
room temperature for 24 ± 2 hours
Dielectric
Meets Initial Values (As Above)
before measuring.
Strength
1mm/sec
90 mm


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