TPD5S116

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SLVSBP3 – DECEMBER 2012

ELECTRICAL CHARACTERISTICS

Max values measured across temp and VCCA=1.1V to 5.5V and 5V_SYS=5.5V. Typical values measured at VCCA=1.8V and

5V_SYS=5V (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply Current

5V_SYS =5V, 5V_CON =Open EN =

Disabled

2

10

µA

GND, HPD_CON=GND

5V_SYS =5V, 5V_CON =Open EN =

Load Switch active

30

50

µA

VCCA, HPD_CON=GND

5V_SYS =5V, 5V_CON =Open EN =

Active

125

200

µA

VCCA, HPD_CON=5V

Load Switch

Reverse voltage comparator trip

5V_SYS=4V, 5V_CON > 5V_SYS

100

mV

point

5V_CON=0V, 5V_SYS=5V ,

EN=GND, HPD_CON=GND

1

5

µA

Measured at 5V_SYS pin.

5V_CON=0V, 5V_SYS=5V ,

EN=GND, HPD_CON=5V Measured

1

5

µA

at 5V_SYS pin

5V_CON =5V, 5V_SYS =0V ,

EN=GND, HPD_CON=GND

1

5

µA

Measured at 5V_CON pin.

Leakage Current

5V_CON =5V, 5V_SYS =0V

EN=GND, HPD_CON=5V Measured

1

5

µA

at 5V_CON pin.

5V_CON =5V, 5V_SYS =0V,

EN=VCCA, HPD_CON=GND

1

5

µA

Measured at 5V_CON pin.

5V_CON =5V, 5V_SYS =0V,

EN=VCCA, HPD_CON=5V Measured

1

5

µA

at 5V_CON pin.

Short circuit current at 5V_CON

5V_SYS=5V, 5V_CON = GND

110

140

170

mA

5V_SYS=5V , EN=VCCA, Short

Deglitch time against false short

3

µs

5V_CON

5V_SYS=0V to 5V, RL = 100

Ω, CL =

UVLO

Under voltage lockout rising

2.85

V

1uF

UVLO_HY

Under voltage lockout falling

5V_SYS=5V to 0V, RL = 100

Ω, CL =

200

mV

S

hysteresis

1uF

5V_OUT output voltage drop

5V_SYS =5V, I5V_OUT = 55 mA

38.5

55

mV

5V_SYS=5V, RL=100

Ω, Cin=10uF,

Inrush Current

140

mA

C=1uF

5V_SYS=5V, RL=100

Ω, Cin=10uF,

Turn on Time, EN to 5V_CON

92.3

µs

C=1uF

5V_SYS=5V, RL=100

Ω, Cin=10uF,

Turn off Time, EN to 5V_CON

5

µs

C=1uF

166

Thermal Shutdown

°C

23

(1)

The TPD5S116 turns off after the device temperature reaches the TRIP temperature.

(2)

Once the thermal shut-down circuit turns off the load switch, the switch turns on again after the device junction temperature cools down

to a temperature equals to or less than TRIP-HYST.

Copyright © 2012, Texas Instruments Incorporated

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