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ACE306X570XXX+ Datasheet(PDF) 7 Page - ACE Technology Co., LTD. |
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ACE306X570XXX+ Datasheet(HTML) 7 Page - ACE Technology Co., LTD. |
7 / 15 page ACE306 Low Voltage Detector with Built-in Delay Circuit / SSD VER 1.3 7 Output Current1 Output Current2 Minimum Operating Voltage Detector Threshold Temperature Coefficient Iout1[mA] Iout2[mA] VDDL[V] - Condition Min. Typ. Condition Min. Typ. Typ. Max. Condition Typ. NCH, VDS=0.05V,VDD=0.7V 0.01 0.05 NCH,VDS=0.5V VDD=0.85V 0.1 0.5 0.5 0.7 -40 ℃ Topt 85℃ 100 VDD=1.0V 0.2 1.0 VDD=1.5V 1.0 2.0 Electrical Characteristics By Output Delay Time Part Number Test Condition Output Delay Time Unit Min Typ Max ACE306XXXXAXX+ VDD=1.0V to Vdet+1.0V 45 50 55 ms ACE306XXXXBXX+ 90 100 110 ACE306XXXXCXX+ 135 150 165 ACE306XXXXDXX+ 180 200 220 ACE306XXXXEXX+ 225 250 275 ACE306XXXXFXX+ 270 300 330 ACE306XXXXGXX+ 360 400 440 Function description High precision low temperature co-efficiency reference voltage is applied to the negative input of a comparator. Input voltage, divided by resistor array of Ra and Rb, is applied to the positive input of the comparator. Output of the comparator passes a delay circuit and a series of buffer to drive the output CMOS pair. VDET =VREF*(1+Ra/Rb) |
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