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AD28MSP02 Datasheet(PDF) 16 Page - Analog Devices |
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AD28MSP02 Datasheet(HTML) 16 Page - Analog Devices |
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AD28msp02 REV. 0 –16– NOISE AND DISTORTION Parameter Min Max Unit Test Conditions ADC Intermodulation Distortion –70 dB DAC Intermodulation Distortion –70 dB ADC Idle Channel Noise 72 dBm0 DAC Idle Channel Noise 72 dBm0 ADC Crosstalk –65 dB ADC input signal level: 1.0 kHz, 0 dBm0 DAC input at idle DAC Crosstalk –65 dB ADC input signal level: analog ground DAC output signal level: 1.0 kHz, 0 dBm0 ADC Power Supply Rejection –55 dB Input signal level at VCC and VDD pins: 1.0 kHz, 100 mV p-p sine wave DAC Power Supply Rejection 55 dB Input signal level at VCC and VDD pins: 1.0 kHz, 100 mV p-p sine wave ADC Group Delay 1 1 ms 300–3000 Hz DAC Group Delay 1 1 ms 300–3000 Hz 1Guaranteed but not tested. 70 –10 10 0 30 20 40 50 60 3.17 –55 –60 0 –5 –10 –15 –25 –30 –35 –40 –45 –50 –20 V – dBm0 IN Figure 17. SNR + THD vs. VIN ORDERING GUIDE Part Temperature Package Number Range Package Option* AD28msp02KN 0 °C to +70°C 24-Pin Plastic DIP N-24 AD28msp02KR 0 °C to +70°C 28-Lead SOIC R-28 AD28msp02BN –40 °C to +85°C 24-Pin Plastic DIP N-24 AD28msp02BR –40 °C to +85°C 28-Lead SOIC R-28 *N = Plastic DIP, R = Small Outline (SOIC). |
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