CBTL04083A_CBTL04083B

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© NXP B.V. 2012. All rights reserved.

Product data sheet

Rev. 4 — 25 June 2012

8 of 19

NXP Semiconductors

CBTL04083A; CBTL04083B

3.3 V, 4 differential channel, 2 : 1 MUX/deMUX switch for PCIe Gen3

9.

Limiting values

[1]

Human Body Model: ANSI/EOS/ESD-S5.1-1994, standard for ESD sensitivity testing, Human Body Model -

Component level; Electrostatic Discharge Association, Rome, NY, USA.

[2]

Charged Device Model: ANSI/EOS/ESD-S5.3-1-1999, standard for ESD sensitivity testing, Charged Device

Model - Component level; Electrostatic Discharge Association, Rome, NY, USA.

10. Recommended operating conditions

11. Static characteristics

[1]

°C, and maximum loading.

[2]

Input leakage current is

±50 μA if differential pairs are pulled to HIGH and LOW.

Table 5.

Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).

Symbol

Parameter

Conditions

Min

Max

Unit

supply voltage

−0.3

+4.6

V

case temperature

−40

+85

°C

electrostatic discharge voltage

HBM

[1] -

2000

V

CDM

[2] -

1000

V

Table 6.

Recommended operating conditions

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

supply voltage

3.0

3.3

3.6

V

input voltage

-

-

V

ambient temperature

operating in free air

−40

-

+85

°C

Table 7.

Static characteristics

Symbol

Parameter

Conditions

Min

Typ[1]

Max

Unit

supply current

operating mode (both XSD01

and XSD23 are LOW);

-2.7

5

mA

shutdown mode (both XSD01

and XSD23 are HIGH);

--

1

μA

HIGH-level input current

--

±5[2]

μA

LOW-level input current

-

-

±5[2]

μA

HIGH-level input voltage

SEL, XSD01, XSD23 pins

--

V

LOW-level input voltage

SEL, XSD01, XSD23 pins

−0.5

-

V

input voltage

differential pins

-

-

2.4

V

SEL, XSD01, XSD23 pins

-

-

V

common-mode input voltage

0

-

2

V

differential input voltage

peak-to-peak

-

-

1.6

V