 |
Electronic Components Datasheet Search |
|
|
Electronic Components Datasheet Search |
|
CXK58512TM Datasheet(PDF) 4 Page - Sony Corporation |
|
||||||||||||||||||||||||||||||
CXK58512TM Datasheet(HTML) 4 Page - Sony Corporation |
|
|
4 / 12 page 
– 4 – CXK58512TM/M Input capacitance I/O capacitance Item Symbol Test conditons Min. Typ. Max. Unit CIN CI/O — — — — 7 8 pF pF VIN = 0V VI/O = 0V Input pulse high level Input pulse low level Input rise time Input fall time Input and output reference level -55LL Output load conditions -70LL/10LL VIH = 2.2V VIL = 0.8V tr = 5ns tf = 5ns 1.5V CL∗ = 30pF, 1TTL CL∗ = 100pF, 1TTL Item Conditions AC Characteristics • AC test conditions (VCC = 5V ± 10%, Ta = 0 to +70°C) ∗ C L includes scope and jig capacitances. I/O capacitance (Ta = 25°C, f = 1MHz) Note) This parameter is sampled and is not 100% tested. TTL C L • Test circuit |
English ▼
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
