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3 of 10

FX-703 Low Jitter VCSO Frequency Translator and Jitter Attenuator

3

3

Rev: 03Apr2012

Stresses in excess of the absolute maximum ratings can permanently damage the device. Functional operation is not implied

at these or any other conditions in excess of conditions represented in the operational sections of this data sheet. Exposure to

absolute maximum ratings for extended periods may adversely affect device reliability.

The FX-703 is capable of meeting the following qualification tests:

Although ESD protection circuitry has been designed into the the FX-703, proper precautions should be taken when handling

and mounting. VI employs a Human Body Model (HBM) and a Charged Device Model (CDM) for ESD susceptibility testing and

design protection evaluation. ESD thresholds are dependent on the circuit parameters used to define the model.

Reliability

Absolute Maximum Ratings

Table 2. Absolute Maximum Ratings

Parameter

Symbol

Ratings

Unit

Power Supply

V

CC

0 to 6

V

Input Current

I

IN

100

mA

Output Current

I

OUT

25

mA

Storage Temperature

T

STR

-55 to 125

0C

Soldering Temperature/Duration

T

PEAK

/t

P

260 / 40

0C/sec

Table 3. Environmental Compliance

Parameter

Conditions

Mechanical Shock

MIL-STD-883, Method 2002

Mechanical Vibration

MIL-STD-883, Method 2007

Solderability

MIL-STD-883, Method 2003

Gross and Fine Leak

MIL-STD-883, Method 1014

Resistance to Solvents

MIL-STD-883, Method 2016

Moisture Sensitivity Level Rating

MSL 1

Handling Precautions

Table 4. Predicted ESD Ratings

Model

Class

Minimum

Conditions

Human Body Model

2

2000 V

MIL-STD 883, Method 3015

Charged Device Model

C5

1000 V

JEDEC, JESD22-C101

Machine Model

M3

200 V

ESD STM5.2-1999

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