CY7C1351G

Document Number: 38-05513 Rev. *K

Page 10 of 20

Automatic CE power-down

current – CMOS inputs

7.5-ns cycle,

133 MHz

–75

mA

10-ns cycle,

100 MHz

–65

mA

Automatic CE power-down

current – TTL inputs

f = 0, inputs static

All speeds

–

45

mA

Over the Operating Range

Description

Test Conditions

Min

Max

Unit

Capacitance

Parameter [11]

Description

Test Conditions

100-pin TQFP

Max

Unit

Input capacitance

5pF

Clock input capacitance

5pF

I/O capacitance

5pF

Thermal Resistance

Parameter [11]

Description

Test Conditions

100-pin TQFP

Package

Unit

Thermal resistance

(junction to ambient)

Test conditions follow standard test methods and

procedures for measuring thermal impedance, per

EIA/JESD51.

30.32

°C/W

Thermal resistance

(junction to case)

6.85

°C/W

Note

11. Tested initially and after any design or process changes that may affect these parameters.