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LM317LDR2 Datasheet(PDF) 3 Page - ON Semiconductor |
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LM317LDR2 Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 12 page LM317L, NCV317LB http://onsemi.com 3 ELECTRICAL CHARACTERISTICS (VI-VO = 5.0 V; IO = 40 mA; TJ = Tlow to Thigh (Note 3); Imax and Pmax (Note 4); unless otherwise noted.) LM317L, LB, NCV317LB Characteristics Figure Symbol Min Typ Max Unit Line Regulation (Note 5) TA = 25°C, 3.0 V ≤ VI - VO ≤ 40 V 1 Regline - 0.01 0.04 %/V Load Regulation (Note 5), TA = 25°C 10 mA ≤ IO ≤ Imax - LM317L VO ≤ 5.0 V VO ≥ 5.0 V 2 Regload - - 5.0 0.1 25 0.5 mV % VO Adjustment Pin Current 3 IAdj - 50 100 mA Adjustment Pin Current Change 2.5 V ≤ VI - VO ≤ 40 V, PD ≤ Pmax 10 mA ≤ IO ≤ Imax - LM317L 1, 2 DIAdj - 0.2 5.0 mA Reference Voltage 3.0 V ≤ VI - VO ≤ 40 V, PD ≤ Pmax 10 mA ≤ IO ≤ Imax - LM317L 3 Vref 1.20 1.25 1.30 V Line Regulation (Note 5), 3.0 V ≤ VI - VO ≤ 40 V 1 Regline - 0.02 0.07 %/V Load Regulation (Note 5) 10 mA ≤ IO ≤ Imax - LM317L VO ≤ 5.0 V VO ≥ 5.0 V 2 Regload - - 20 0.3 70 1.5 mV % VO Temperature Stability (Tlow ≤ TJ ≤ Thigh) 3 TS - 0.7 - % VO Minimum Load Current to Maintain Regulation (VI - VO = 40 V) 3 ILmin - 3.5 10 mA Maximum Output Current VI - VO ≤ 6.25 V, PD ≤ Pmax, Z Package VI - VO ≤ 40 V, PD ≤ Pmax, TA = 25°C, Z Package 3 Imax 100 - 200 20 - - mA RMS Noise, % of VO TA = 25°C, 10 Hz ≤ f ≤ 10 kHz - N - 0.003 - % VO Ripple Rejection (Note 6) VO = 1.2 V, f = 120 Hz CAdj = 10 mF, VO = 10.0 V 4 RR 60 - 80 80 - - dB Thermal Shutdown (Note 7) - - - 180 - °C Long Term Stability, TJ = Thigh (Note 8) TA = 25°C for Endpoint Measurements 3 S - 0.3 1.0 %/1.0 k Hrs. 3. Tlow to Thigh = 0° to +125°C for LM317L -40 ° to +125°C for LM317LB, NCV317LB 4. Imax = 100 mAPmax = 625 mW 5. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty cycle is used. 6. CAdj, when used, is connected between the adjustment pin and ground. 7. Thermal characteristics are not subject to production test. 8. Since Long-Term Stability cannot be measured on each device before shipment, this specification is an engineering estimate of average stability from lot to lot. |
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