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SN74AC32MDREP Datasheet(PDF) 1 Page - Texas Instruments |
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SN74AC32MDREP Datasheet(HTML) 1 Page - Texas Instruments |
1 / 8 page SN74AC32EP QUADRUPLE 2INPUT POSITIVEOR GATE SCAS720 − OCTOBER 2003 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of −55 °C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. D 2-V to 6-V VCC Operation D Inputs Accept Voltages to 6 V D Max tpd of 7.5 ns at 5 V description/ordering information The SN74AC32 is a quadruple 2-input positive-OR gate. The device performs the Boolean function Y = A + B or Y = A • B in positive logic. ORDERING INFORMATION TA PACKAGE‡ ORDERABLE PART NUMBER TOP-SIDE MARKING −55 °C to 125°C SOIC − D Tape and reel SN74AC32MDREP SAC32MEP ‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. FUNCTION TABLE (each gate) INPUTS OUTPUT A B OUTPUT Y H X H X HH L L L logic diagram, each gate (positive logic) A B Y Copyright 2003, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. D PACKAGE (TOP VIEW) 1 2 3 4 5 6 7 14 13 12 11 10 9 8 1A 1B 1Y 2A 2B 2Y GND VCC 4B 4A 4Y 3B 3A 3Y Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. |
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