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TPS62366AYZHR Datasheet(PDF) 3 Page - Texas Instruments

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Part # TPS62366AYZHR
Description  4A Processor Supply with I2C Compatible Interface and Remote Sense
Download  48 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

TPS62366AYZHR Datasheet(HTML) 3 Page - Texas Instruments

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TPS62366A, TPS62366B
www.ti.com
SLUSAX3 – JULY 2012
THERMAL INFORMATION
TPS62366x
THERMAL METRIC(1)
YZH
UNITS
16 PINS
θJA
Junction-to-ambient thermal resistance(2)
94.8
θJCtop
Junction-to-case (top) thermal resistance(3)
25
θJB
Junction-to-board thermal resistance(4)
60
°C/W
ψJT
Junction-to-top characterization parameter(5)
3.2
ψJB
Junction-to-board characterization parameter(6)
57
θJCbot
Junction-to-case (bottom) thermal resistance(7)
n/a
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2)
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3)
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-
standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4)
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(5)
The junction-to-top characterization parameter,
ψJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining
θJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6)
The junction-to-board characterization parameter,
ψJB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining
θJA , using a procedure described in JESD51-2a (sections 6 and 7).
(7)
The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
Spacer
RECOMMENDED OPERATING CONDITIONS
(1)
MIN
TYP
MAX
UNIT
IOUT ≤ 2.5A
2.5
5.5
VIN
Input voltage range, VIN
V
IOUT ≥ 2.5A
2.8
5.5
IOUT,avg
Continuous output current(1)
2.5
A
trf
Rising and falling signal transition time at EN, VSEL
30
mV/µs
TA
Operating ambient temperature(2)
–40
85
°C
TJ
Operating junction temperature
–40
150
°C
(1)
Refer to the APPLICATION INFORMATION section for further information.
(2)
In applications where high power dissipation and/or poor package thermal resistance is present, the maximum ambient temperature may
have to be derated. Maximum ambient temperature [TA(max)] is dependent on the maximum operating junction temperature [TJ(max)], the
maximum power dissipation of the device in the application [PD(max)], and the junction-to-ambient thermal resistance of the part/package
in the application (
θJA), as given by the following equation: TA(max) = TJ(max) – (θJA × PD(max))
Copyright © 2012, Texas Instruments Incorporated
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Product Folder Link(s): TPS62366A TPS62366B


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