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DAC5662 Datasheet(PDF) 3 Page - Texas Instruments |
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DAC5662 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 25 page ABSOLUTE MAXIMUM RATINGS DAC5662 www.ti.com ................................................................................................................................................................ SLAS425B – JULY 2004 – REVISED MAY 2007 TERMINAL FUNCTIONS (continued) TERMINAL I/O DESCRIPTION NAME NO. DGND 15, 21 I Digital ground DVDD 16, 22 I Digital supply voltage EXTIO 43 I/O Internal reference output (bypass with 0.1 µF to AGND) or external reference input. GSET 42 I Gain-setting mode: H - 1 resistor, L - 2 resistors. Internal pullup. IOUTA1 46 O DACA current output. Full-scale with all bits of DA high. IOUTA2 45 O DACA complementary current output. Full-scale with all bits of DA low. IOUTB1 39 O DACB current output. Full-scale with all bits of DB high. IOUTB2 40 O DACB complementary current output. Full-scale with all bits of DB low. MODE 48 I Mode Select: H – Dual Bus, L – Interleaved. Internal pullup. 13, 14, 35, NC - No connection 36 Sleep function control input: H – DAC in power-down mode, L – DAC in operating mode. Internal SLEEP 37 I pulldown. WRTA/WRTIQ 17 I Input write signal for PORT A (WRTIQ in interleaving mode). WRTB/SELEC 20 I Input write signal for PORT B (SELECTIQ in interleaving mode). TIQ over operating free-air temperature range (unless otherwise noted) (1) UNIT AVDD(2) -0.5 V to 4 V Supply voltage range DVDD(3) -0.5 V to 4 V Voltage between AGND and DGND -0.5 V to 0.5 V Voltage between AVDD and DVDD -0.5 V to 0.5 V DA[11:0] and DB[11:0](3) -0.5 V to DVDD + 0.5 V MODE, SLEEP, CLKA, CLKB, WRTA, WRTB(3) -0.5 V to DVDD + 0.5 V Supply voltage range IOUTA1, IOUTA2, IOUTB1, IOUTB2(2) -1 V to AVDD + 0.5 V EXTIO, BIASJ_A, BIASJ_B, GSET(2) -0.5 V to AVDD + 0.5 V Peak input current (any input) +20 mA Peak total input current (all inputs) -30 mA Operating free-air temperature range -40 °C to 85 °C Storage temperature range -65 °C to 150 °C (1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Measured with respect to AGND. (3) Measured with respect to DGND. Copyright © 2004–2007, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Link(s): DAC5662 |
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