CY14B101LA

CY14B101NA

Document Number: 001-42879 Rev. *O

Page 10 of 29

[21]

Storage capacitor

61

68

180

µF

[22, 23]

pin by the device

–

–

V

Data Retention and Endurance

Over the Operating Range

Parameter

Description

Min

Unit

Data retention

20

Years

Nonvolatile STORE operations

1,000

K

Capacitance

Parameter[23]

Description

Test Conditions

Max

Unit

7pF

Input capacitance (for BHE, BLE and HSB)8

pF

Output capacitance (except HSB)

7

pF

Output capacitance (for HSB)

8

pF

Thermal Resistance

Parameter[23]

Description

Test Conditions

54-pin

TSOP II

48-pin

SSOP

48-ball

FBGA

44-pin

TSOP II

32-pin

SOIC

Unit



JA

Thermal resistance

(junction to ambient)

Test

conditions

follow

standard test methods and

procedures for measuring

thermal

impedance,

in

accordance

with

EIA/JESD51.

36.4

37.47

48.19

41.74

41.55

C/W



JC

Thermal resistance

(junction to case)

10.13

24.71

6.5

11.90

24.43

C/W

Parameter

Description

Test Conditions

Min

Max

Unit

Notes

VCAP is charged to a minimum voltage during a Power-Up RECALL cycle so that an immediate power-down cycle can complete a successful AutoStore. Therefore it

23. These parameters are guaranteed by design and are not tested.