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SP207ECT Datasheet(PDF) 10 Page - Sipex Corporation |
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SP207ECT Datasheet(HTML) 10 Page - Sipex Corporation |
10 / 16 page SP207EDS/09 SP207E Series High Performance RS232 Transceivers © Copyright 2000 Sipex Corporation 10 R RS S and and R RV V add up to 330 add up to 330 Ω Ω ffor IEC1000-4-2. or IEC1000-4-2. RS and RV add up to 330Ω for IEC1000-4-2. Contact-Discharge Module Contact-Discharge Module R RV V R RC C C CS S R RS S SW1 SW1 SW2 SW2 RC Device Under Test DC Power Source CS RS SW1 SW2 RV Contact-Discharge Module Figure 8. ESD Test Circuit for IEC1000-4-2 Figure 9. ESD Test Waveform for IEC1000-4-2 With the Air Discharge Method, an ESD voltage is applied to the equipment under test (EUT) through air. This simulates an electrically charged person ready to connect a cable onto the rear of the system only to find an unpleasant zap just before the person touches the back panel. The high energy potential on the person discharges through an arcing path to the rear panel of the system before he or she even touches the system. This energy, whether discharged directly or through air, is predominantly a function of the discharge current rather than the discharge voltage. Variables with an air discharge such as approach speed of the object carrying the ESD potential to the system and humidity will tend to change the discharge current. For example, the rise time of the discharge current varies with the approach speed. The Contact Discharge Method applies the ESD current directly to the EUT. This method was devised to reduce the unpredictability of the ESD arc. The discharge current rise time is constant since the energy is directly transferred without the air-gaparc. Insituationssuchashandheldsystems, the ESD charge can be directly discharged to the equipment from a person already holding the equipment. The current is transferred on to the keypad or the serial port of the equipment directly andthentravelsthroughthePCBandfinallytotheIC. The circuit model in Figures 7 and 8 represent the typical ESD testing circuit used for all three methods. The CS is initially charged with the DC power supply when the first switch (SW1) is on. Now that the capacitor is charged, the second switch (SW2) is on while SW1 switches off. The voltage stored in the capacitor is then applied through RS, the current limiting resistor, onto the device under test (DUT). In ESD tests, the SW2 switch is pulsed so that the device under test receives a duration of voltage. t=0ns t=30ns 0A 15A 30A t ¥ |
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