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EN29GL064AT Datasheet(PDF) 41 Page - Eon Silicon Solution Inc. |
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EN29GL064AT Datasheet(HTML) 41 Page - Eon Silicon Solution Inc. |
41 / 58 page ![]() This Data Sheet may be revised by subsequent versions ©2004 Eon Silicon Solution, Inc., www.eonssi.com or modifications due to changes in technical specifications. 41 EN29GL064AT/B Rev. B, Issue Date: 2011/04/12 AC CHARACTERISTICS Table 17. Read-only Operations Characteristics Parameter Symbols Speed JEDEC Standard Description Test Setup -70 Unit tAVAV tRC Read Cycle Time Min 70 ns tAVQV tACC Address to Output Delay CE# = VIL OE#= VIL Max 70 ns tELQV tCE Chip Enable To Output Delay OE#= VIL Max 70 ns tPACC Page Access Time Max 25 ns tGLQV tOE Output Enable to Output Delay Max 25 ns tEHQZ tDF Chip Enable to Output High Z Max 20 ns tGHQZ tDF Output Enable to Output High Z Max 20 ns tAXQX tOH Output Hold Time from Addresses, CE# or OE#, whichever occurs first Min 0 ns Read Min 0 ns tOEH Output Enable Hold Time Toggle and DATA# Polling Min 10 ns Notes: High Z is Not 100% tested. Figure 12. AC Waveforms for READ Operations Addresses CE# OE# WE# Outputs RESET# RY/BY# tACC 0V HIGH Z Output Valid tCE tOH tDF tOEH HIGH Z tBOEB tRC Addresses Stable |
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