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XTR108TDD2 Datasheet(PDF) 1 Page - Texas Instruments |
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XTR108TDD2 Datasheet(HTML) 1 Page - Texas Instruments |
1 / 5 page XTR108-DIE www.ti.com SBOS615 – JUNE 2012 TWO-WIRE TRANSMITTER "SMART" PROGRAMMABLE WITH SIGNAL CONDITIONING 1 FEATURES • Complete Transmitter + RTD Linearization APPLICATIONS • Two-Wire Output • Remote RTD Transmitters • Eliminates Potentiometers and Trimming • Pressure Bridge Transmitters • Digitally Calibrated • Strain Gate Transmitters • Serial SPI Bus Interface • SCADA Remote Data Acquisition • Weighing Systems • Industrial Process Control DESCRIPTION The XTR108 is a “smart” programmable, two-wire transmitter designed for temperature and bridge sensors. Zero, span, and linearization errors in the analog signal path can be calibrated via a standard digital serial interface, eliminating manual trimming. Non-volatile external EEPROM stores calibration settings. The all-analog signal path contains an input multiplexer, autozeroed programmable-gain instrumentation amplifier, dual programmable current sources, linearization circuit, voltage reference, sub-regulator, internal oscillator, control logic, and an output current amplifier. Programmable level shifting compensates for sensor DC offsets. Selectable up- and down-scale output indicates out-of-range and burnout per NAMUR NE43. Automatic reset is initiated when supply is lost. Current sources, steered through the multiplexer, can be used to directly excite RTD temperature sensors, pressure bridges, or other transducers. An uncommitted operational amplifier can be used to convert current into a voltage. ORDERING INFORMATION(1) PACKAGE PRODUCT PACKAGE(2) ORDERABLE PART NUMBER PACKAGE QUANTITY DESIGNATOR XTR108TDD1 130 XTR108 TD Bare die in waffle pack XTR108TDD2 10 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 2012, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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