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CL-L400-MC1WW1-A-T Datasheet(PDF) 6 Page - CITIZEN ELECTRONICS CO., LTD. |
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CL-L400-MC1WW1-A-T Datasheet(HTML) 6 Page - CITIZEN ELECTRONICS CO., LTD. |
6 / 12 page 6. Reliability (1) Datails of the tests (2)Judgement Criteria of Failure for Reliability Test (Ta=25 ℃ ) U defines the upper limit of the specified characteristics. S defines the initial value. Note : Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be return to the normal ambient conditions after the completion of each test. CITILED Name CL-L400-MC1WW1-A CITIZEN ELECTRONICS CO.,LTD. JAPAN Symbol DATA SHEET >U X 1.1 <S X 0.70 IF=350mA Forward Voltage Total Luminous Flux 6/12 -40 C × 30 minutes – 100 C × 30 minutes, 100 cycle IF=350mA VF φv Solder heat resistance test Test Item Test Condition Symbol Measuring Condition Judgement Criteria for Failure Measuring Item High Temperature Storage Test Moisture-proof Test Thermal Shock Test Low Temperature Storage Test Continuous Operation Test Recommended temperature profile (reflow soldering)× 2, (2nd test must be started after the samples are stabilized thermally.) Ta=25 C, IF=350mA× 1000 hours -40 C × 1000 hours 100 C × 1000 hours 60 C, 90 %RH for 500 hours Ref.CE-P1589 10/11 |
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