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6. Reliability

(1) Details of the tests

Continuous Operation Test

(2) Judgment Criteria of Failure for Reliability Test

(Ta=25 C)

Symbol

Φv

U defines the upper limit of the specified characteristics. S defines the initial value.

CITIZEN ELECTRONICS CO., LTD. JAPAN

> U × 1.2

Name

CL-L400-MC1L1-A

Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be

Low Temperature Storage Test

Solder Heat Resistance Test

Measuring Item

Thermal Shock Test

-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle

High Temperature Storage Test

Forward Voltage

DATA SHEET

Test Item

Test Condition

Ta=-40 C × 1000 hours

Moisture-proof Test

Ta=60 C, 90 %RH for 1000 hours

　Recommended temperature profile (reflow soldering)　× 2,

Ta=100 C × 1000 hours

　 (2nd test must be started after the samples are　stabilized thermally.)

Measuring Condition

Judgment Criteria for Failure

Total Luminous Flux

< S × 0.7

returned to the normal ambient conditions after the completion of each test.

Symbol

CITILED

Ref.CE-P1158 05/11