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CL-L400-MC1L1-A-T Datasheet(PDF) 6 Page - CITIZEN ELECTRONICS CO., LTD. |
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CL-L400-MC1L1-A-T Datasheet(HTML) 6 Page - CITIZEN ELECTRONICS CO., LTD. |
6 / 12 page 6/12 6. Reliability (1) Details of the tests Continuous Operation Test (2) Judgment Criteria of Failure for Reliability Test (Ta=25 C) Symbol VF Φv U defines the upper limit of the specified characteristics. S defines the initial value. CITIZEN ELECTRONICS CO., LTD. JAPAN > U × 1.2 Name CL-L400-MC1L1-A Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be Low Temperature Storage Test Solder Heat Resistance Test Measuring Item IF=350mA Thermal Shock Test -40 C × 30 minutes – 100 C × 30 minutes, 100 cycle High Temperature Storage Test Forward Voltage DATA SHEET Test Item Test Condition Ta=25 C, IF=350 mA× 1000 hours Ta=-40 C × 1000 hours Moisture-proof Test Ta=60 C, 90 %RH for 1000 hours Recommended temperature profile (reflow soldering) × 2, Ta=100 C × 1000 hours (2nd test must be started after the samples are stabilized thermally.) Measuring Condition Judgment Criteria for Failure IF=350mA Total Luminous Flux < S × 0.7 returned to the normal ambient conditions after the completion of each test. Symbol CITILED Ref.CE-P1158 05/11 |
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