Electronic Components Datasheet Search |
|
CL-L233-MC13N1-C1 Datasheet(PDF) 6 Page - CITIZEN ELECTRONICS CO., LTD. |
|
CL-L233-MC13N1-C1 Datasheet(HTML) 6 Page - CITIZEN ELECTRONICS CO., LTD. |
6 / 11 page 6/11 6. Reliability (1) Details of the tests (2) Judgment Criteria of Failure for Reliability Test (Ta=25 C) Symbol VF Φv U defines the upper limit of the specified characteristics. S defines the initial value. CL-L221-C14L1 reliability test results will be used for CL-L233-MC13N1-C1. Symbol -40 C × 30 minutes – 100 C × 30 minutes, 100 cycle > U × 1.1 CITIZEN ELECTRONICS CO.,LTD. JAPAN Forward Voltage IF=720mA < S × 0.85 Measuring Item Measuring Condition Ta=25 C, IF=720 mA× 1000 hours(with Al-fin) Ta=80 C, Tj ≒ 120 C, IF=720 mA× 1000 hours(with Al-fin) Moisture-proof Test 60 C, 90 %RH for 1000 hours Continuous Operation Test Low Temperature Storage Test Judgment Criteria for Failure Test Item Test Condition DATA SHEET CITILED Name CL-L233-MC13N1-C1 Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be -40 C × 1000 hours High Temperature Storage Test 100 C × 1000 hours Thermal Shock Test IF=720mA returned to the normal ambient conditions after the completion of each test. Total Luminous Flux Ref.CE-P1344 07/11 |
Similar Part No. - CL-L233-MC13N1-C1 |
|
Similar Description - CL-L233-MC13N1-C1 |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.COM |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Datasheet Upload | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |