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CLRC663 Datasheet(PDF) 32 Page - NXP Semiconductors

Part # CLRC663
Description  Contactless reader IC
Download  132 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

CLRC663 Datasheet(HTML) 32 Page - NXP Semiconductors

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CLRC663
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2012. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.3 — 3 April 2012
171133
32 of 132
NXP Semiconductors
CLRC663
Contactless reader IC
used, the TDO pin is placed in an inactive drive state when not actively shifting out data.
Because TDO can be connected to the TDI of another controller in a daisy-chain
configuration, the IEEE Standard 1149.1 expects the value on TDO to change on the
falling edge of TCK.
8.4.6.6
Data register
According to the IEEE1149.1 standard there are two types of data register defined:
bypass and boundary scan
The bypass register enable the possibility to bypass a device when part of the scan
path.Serial data is allowed to be transferred through a device from the TDI pin to the TDO
pin without affecting the operation of the device.
The boundary scan register is the scan-chain of the boundary cells. The size of this
register is dependent on the command.
8.4.6.7
Boundary scan cell
The boundary scan cell opens the possibility to control a hardware pin independent of its
normal use case. Basically the cell can only do one of the following: control, output and
input.
8.4.6.8
Boundary scan path
This chapter shows the boundary scan path of the CLRC663.
Fig 24. Boundary scan cell path structure
001aam306
TAP
TAP
IC1
IC2
TCK
TMS
TCK
TMS
TDO
TDO
Boundary scan cell
TDI
TDI
Table 26.
Boundary scan path of the CLRC663
Number (decimal)
Cell
Port
Function
23
BC_1
-
Control
22
BC_8
CLKOUT
Bidir
21
BC_1
-
Control
20
BC_8
SCL2
Bidir
19
BC_1
-
Control
18
BC_8
SDA2
Bidir
17
BC_1
-
Control
16
BC_8
IFSEL0
Bidir
15
BC_1
-
Control
14
BC_8
IFSEL1
Bidir


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