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CLRC663 Datasheet(PDF) 30 Page - NXP Semiconductors

Part No. CLRC663
Description  Contactless reader IC
Download  132 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

CLRC663 Datasheet(HTML) 30 Page - NXP Semiconductors

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CLRC663
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2012. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.3 — 3 April 2012
171133
30 of 132
NXP Semiconductors
CLRC663
Contactless reader IC
8.4.5.2
SAM connection
The CLRC663 provides an interface to connect a SAM dedicated to the CLRC663. Both
interface options of the CLRC663, I2C or I2CL can be used for this purpose. The interface
option of the SAM itself is configured by a host command sent from the host to the SAM.
The I2CL interface is intended to be used as connection between two IC’s over a short
distance. The protocol fulfills the I2C specification, but does support a single device
connected to the bus only.
8.4.6 Boundary scan interface
The CLRC663 provides a boundary scan interface according the IEEE 1149.1. This
interface allows to test interconnections without using physical test probes. This is done
by test cells, assigned to each pin, which override the functionality of this pin.
To be able to program the test cells, the following commands are supported:
The Standard IEEE 1149.1 describes the four basic blocks necessary to use this interface:
Test Access Port (TAP), TAP controller, TAP instruction register, TAP data register;
Fig 23. I2C interface enables convenient MIFARE SAM integration
μC
Reader
I2C
I2C
aaa-002963
SAM
AV2.6
READER
IC
Table 25.
Boundary scan command
Value
(decimal)
Command
Parameter in
Parameter out
0
bypass
-
-
1
preload
data (24)
-
1
sample
-
data (24)
2
ID code (default)
-
data (32)
3
USER code
-
data (32)
4Clamp
-
-
5HIGH Z
-
-
7
extest
data (24)
data (24)
8
interface on/off
interface (1)
-
9
register access read
address (7)
data (8)
10
register access write
address (7) - data (8)
-


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