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HYB511000BJ- Datasheet(PDF) 2 Page - Siemens Semiconductor Group |
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HYB511000BJ- Datasheet(HTML) 2 Page - Siemens Semiconductor Group |
2 / 22 page ![]() Semiconductor Group 34 HYB 511000BJ/BJL-50/-60/-70 1 M × 1-DRAM The HYB 511000BJ/BJL is the new generation dynamic RAM organized as 1 048 576 words by 1-bit. The HYB 511000BJ/BJL utilizes CMOS silicon gate process technology as well as advanced circuit techniques to provide wide operating margins, both internally and for the system user. Multiplexed address inputs permit the HYB 511000BJ/BJL to be packaged in a standard plastic P-SOJ-26/20. This package size provides high system bit densities and is compatible with commonly used automatic testing and insertion equipment. System oriented features include single + 5 V ( ± 10 %) power supply, direct interfacing with high-performance logic device families such as Schottky TTL. “Test Mode” function is implemented. The HYB 511000BJL are specially selected for low power battery backup applications. Pin Definitions and Functions Pin No. Function A0-A9 Address Inputs RAS Row Address Strobe DI Data In DO Data Out CAS Column Address Strobe WE Read/Write Input V CC Power Supply (+ 5 V) V SS Ground (0 V) TF Test Function N.C. No Connection |