Document Number: 69934

S11-1429-Rev. C, 18-Jul-11

www.vishay.com

9

This document is subject to change without notice.

Vishay Siliconix

DG604

TEST CIRCUITS

Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon

Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and

Figure 4. Charge Injection

A0

A1

ENABLE

GND

V+

V-

V-

V+

1 nF

D

Sx

0 V

Channel

Select

ON

OFF

CHARGE INJECTION =

ΔV

O

Figure 5. Insertion Loss

Figure 7. Crosstalk

A0

A1

ENABLE

GND

V+

V-

V-

V+

D

S1

50

Ω

Network Analyzer

Insertion Loss = 20 log

V+

A0

A1

ENABLE

GND

V

V-

V-

V

D

S4

50

Ω

Network Analyzer

Crosstalk = 20 log

50

Ω

S1

V+

Figure 6. Off-Isolation

Figure 8. Source/Drain Capacitance

A0

A1

ENABLE

GND

V+

V-

V-

V+

D

S4

50

Ω

Network Analyzer

Off Isolation = 20 log

A0

A1

ENABLE

GND

V+

V-

V+

D

S1

|

to

|

S4

Impedance

Analyzer

Channel

Select

V-

V+