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8

Document Number: 71470

S09-1053-Rev. D, 08-Jun-09

Vishay Siliconix

DG469, DG470

TEST CIRCUITS

Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon

Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and

Figure 2. Break-Before-Make

IN

COM

V -

NC

V+

NO

- 15 V

GND

V+

35 pF

50

Ω

0 V

Logic

Input

Switch

Output

90 %

Figure 3. Charge Injection

1 nF

NO or NC

V+

COM

V-

3 V

EN

- 15 V

GND

+ 15 V

OFF

ON

OFF

OFF

ON

OFF

Q =

IN

Switch under test

NO

NC

IN

Figure 4. Off-Isolation

V+

S

D

- 15 V

GND

V -

C

IN

0 V, 2.4 V

Off Isolation = 20 log

+ 15 V

C

50

Ω

C = RF Bypass

Figure 5. Source/Drain Capacitances

IN

S

V+

D

C

0 V, 2.4 V

Meter

HP4192A

Impedance

Analyzer

or Equivalent

+ 15 V

C

IN

S

V+

D

- 15 V

GND

V-

C

0 V, 2.4 V

C