FM24CL64B - 64Kb 3V I2C F-RAM (Automotive Temp.)

Rev. 1.1

June 2011

Page 10 of 12

AC Test Conditions

Equivalent AC Test Load Circuit

Input Pulse Levels

Input rise and fall times

10 ns

Input and output timing levels

Diagram Notes

All start and stop timing parameters apply to both read and write cycles.

Clock specifications are identical for read and write cycles. Write

timing parameters apply to slave address, word address, and write data

bits. Functional relationships are illustrated in the relevant datasheet

sections. These diagrams illustrate the timing parameters only.

Read Bus Timing

t

SU:SDA

Start

t

R

`

t

F

Stop Start

t

BUF

t

HIGH

1/fSCL

t

LOW

t

SP

t

SP

Acknowledge

t

HD:DAT

t

SU:DAT

t

AA

t

DH

SCL

SDA

Write Bus Timing

t

SU:STO

Start

Stop Start

Acknowledge

t

AA

t

HD:DAT

t

HD:STA

t

SU:DAT

SCL

SDA

Data Retention

Parameter

Min

Max

Units

Notes

Data Retention

@

@

@

17

10,000

1,000

-

-

-

Years

Hours

Hours

Note: Data retention qualification tests are accelerated tests and are performed such that all three conditions have been applied:

(1) 17 years at a temperature of +55C, (2) 10,000 hours at +105C, and (3) 1,000 hours at +125C.

Typical Grade 1 Operating Profile

0

200

400

600

800

1000

1200

1400

1600

70

75

80

85

90

95 100 105 110 115 120 125

Temperature (°C)

Typical Grade 1 Storage Profile

0

5000

10000

15000

20000

25000

0

5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80

Temperature (°C)

3.6V

Output

100 pF