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CC2530F32 Datasheet(PDF) 9 Page - Texas Instruments

Part # CC2530F32
Description  A True System-on-Chip Solution for 2.4-GHz IEEE 802.15.4 and ZigBee Applications
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

CC2530F32 Datasheet(HTML) 9 Page - Texas Instruments

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CC2530F32, CC2530F64
CC2530F128, CC2530F256
www.ti.com
SWRS081B
– APRIL 2009 – REVISED FEBRUARY 2011
16-MHz RC OSCILLATOR
Measured on Texas Instruments CC2530 EM reference design with TA = 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Frequency(1)
16
MHz
Uncalibrated frequency accuracy
±18%
Calibrated frequency accuracy
±0.6%
±1%
Start-up time
10
μs
Initial calibration time(2)
50
μs
(1)
The calibrated 16-MHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 2.
(2)
When the 16-MHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator
is performed while SLEEPCMD.OSC_PD is set to 0.
RSSI/CCA CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with TA = 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
RSSI range
100
dB
Absolute uncalibrated RSSI/CCA accuracy
±4
dB
RSSI/CCA offset(1)
73
dB
Step size (LSB value)
1
dB
(1)
Real RSSI = Register value
– offset
FREQEST CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with TA = 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
FREQEST range
±250
kHz
FREQEST accuracy
±40
kHz
FREQEST offset(1)
20
kHz
Step size (LSB value)
7.8
kHz
(1)
Real FREQEST = Register value
– offset
FREQUENCY SYNTHESIZER CHARACTERISTICS
Measured on Texas Instruments CC2530 EM reference design with TA = 25°C, VDD = 3 V and fc = 2440 MHz, unless
otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
At
±1-MHz offset from carrier
–110
Phase noise, unmodulated carrier
At
±2-MHz offset from carrier
–117
dBc/Hz
At
±5-MHz offset from carrier
–122
ANALOG TEMPERATURE SENSOR
Measured on Texas Instruments CC2530 EM reference design with TA = 25°C and VDD = 3 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Output at 25
°C
1480
12-bit ADC
Temperature coefficient
4.5
/1
°C
Voltage coefficient
1
/0.1 V
Measured using integrated ADC using
Initial accuracy without calibration
±10
°C
internal bandgap voltage reference and
maximum resolution
Accuracy using 1-point calibration (entire
±5
°C
temperature range)
Current consumption when enabled (ADC
0.5
mA
current not included)
© 2009–2011, Texas Instruments Incorporated
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Product Folder Link(s): CC2530F32 CC2530F64 CC2530F128 CC2530F256


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