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CAT24C512YI-GT3 Datasheet(PDF) 3 Page - ON Semiconductor

Part # CAT24C512YI-GT3
Description  512 kb I2C CMOS Serial EEPROM 128?묪yte Page Write Buffer
Download  15 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

CAT24C512YI-GT3 Datasheet(HTML) 3 Page - ON Semiconductor

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CAT24C512
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3
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Ratings
Units
Storage Temperature
–65 to +150
°C
Voltage on any Pin with Respect to Ground (Note 1)
–0.5 to +6.5
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol
Parameter
Min
Units
NEND (Note 3)
Endurance
1,000,000
Program/Erase Cycles
TDR
Data Retention
100
Years
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
3. Page Mode, VCC = 5 V, 25°C.
Table 3. D.C. OPERATING CHARACTERISTICS
VCC = 1.8 V to 5.5 V, TA = −40°C to +85°C and VCC = 2.5 V to 5.5 V, TA = −40°C to +125°C, unless otherwise specified.
Symbol
Parameter
Test Conditions
Min
Max
Units
ICCR
Read Current
Read, fSCL = 400 kHz/1 MHz
1
mA
ICCW
Write Current
3
mA
ISB
Standby Current
All I/O Pins at GND or VCC
TA = −40°C to +85°C
2
mA
TA = −40°C to +125°C
5
IL
I/O Pin Leakage
Pin at GND or VCC
TA = −40°C to +85°C
1
mA
TA = −40°C to +125°C
2
VIL1
Input Low Voltage
2.5 V ≤ VCC ≤ 5.5 V
−0.5
0.3 VCC
V
VIL2
Input Low Voltage
1.8 V ≤ VCC < 2.5 V
−0.5
0.25 VCC
V
VIH1
Input High Voltage
2.5 V ≤ VCC ≤ 5.5 V
0.7 VCC
VCC + 0.5
V
VIH2
Input High Voltage
1.8 V ≤ VCC < 2.5 V
0.75 VCC
VCC + 0.5
V
VOL1
Output Low Voltage
VCC ≥ 2.5 V, IOL = 3.0 mA
0.4
V
VOL2
Output Low Voltage
VCC < 2.5 V, IOL = 1.0 mA
0.2
V
Table 4. PIN IMPEDANCE CHARACTERISTICS
VCC = 1.8 V to 5.5 V, TA = −40°C to +85°C and VCC = 2.5 V to 5.5 V, TA = −40°C to +125°C, unless otherwise specified.
Symbol
Parameter
Conditions
Max
Units
CIN (Note 4)
SDA I/O Pin Capacitance
VIN = 0 V
8
pF
CIN (Note 4)
Input Capacitance (other pins)
VIN = 0 V
6
pF
IWP, IA (Note 5)
WP Input Current, Address Input
Current (A0, A1, A2)
VIN < VIH, VCC = 5.5 V
75
mA
VIN < VIH, VCC = 3.3 V
50
VIN < VIH, VCC = 1.8 V
25
VIN > VIH
2
4. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
5. When not driven, the WP, A0, A1, A2 pins are pulled down to GND internally. For improved noise immunity, the internal pull−down is relatively
strong; therefore the external driver must be able to supply the pull−down current when attempting to drive the input HIGH. To conserve power,
as the input level exceeds the trip point of the CMOS input buffer (~ 0.5 x VCC), the strong pull−down reverts to a weak current source.


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