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CY7C1041CV33-10ZSXA Datasheet(PDF) 7 Page - Cypress Semiconductor

Part # CY7C1041CV33-10ZSXA
Description  4-Mbit (256 K 횞 16) Static RAM TTL-compatible inputs and outputs
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

CY7C1041CV33-10ZSXA Datasheet(HTML) 7 Page - Cypress Semiconductor

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CY7C1041CV33 Automotive
Document Number: 001-67307 Rev. **
Page 7 of 17
Switching Characteristics
Over the Operating Range [4]
Parameter
Description
-10
-12
-20
Unit
Min
Max
Min
Max
Min
Max
Read Cycle
tpower[5]
VCC(Typical) to the First Access
100
100
100
s
tRC
Read Cycle Time
10
12
20
ns
tAA
Address to Data Valid
10
12
20
ns
tOHA
Data Hold from Address Change
3
3
3
ns
tACE
CE LOW to Data Valid
10
12
20
ns
tDOE
OE LOW to Data Valid
Auto-A
–5–
6–8
ns
Auto-E
–––
7–8
tLZOE
OE LOW to Low Z[6]
0–0
–0–
ns
tHZOE
OE HIGH to High Z[6, 7]
–5–
6–8
ns
tLZCE
CE LOW to Low Z[6]
3–3
–3–
ns
tHZCE
CE HIGH to High Z[6, 7]
–5–
6–8
ns
tPU
CE LOW to Power Up
0–0
–0–
ns
tPD
CE HIGH to Power Down
10
12
20
ns
tDBE
Byte Enable to Data Valid
Auto-A
5
6
8
ns
Auto-E
–––
7–8
tLZBE
Byte Enable to Low Z
0
0
0
ns
tHZBE
Byte Disable to High Z
6
6
8
ns
Write Cycle[8, 9]
tWC
Write Cycle Time
10
12
20
ns
tSCE
CE LOW to Write End
7
8
10
ns
tAW
Address Setup to Write End
7
8
10
ns
tHA
Address Hold from Write End
0
0
0
ns
tSA
Address Setup to Write Start
0
0
0
ns
tPWE
WE Pulse Width
7
8
–10–
ns
tSD
Data Setup to Write End
5–6
–8–
ns
tHD
Data Hold from Write End
0
0
0
ns
tLZWE
WE HIGH to Low Z[6]
3–3
–3–
ns
tHZWE
WE LOW to High Z[6, 7]
–5–
6–8
ns
tBW
Byte Enable to End of Write
7
8
10
ns
Notes
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, and input pulse levels of 0 to 3.0 V.
5. tPOWER gives the minimum amount of time that the power supply is at typical VCC values until the first memory access is performed.
6. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device.
7. tHZOE, tHZCE, tHZBE, and tHZWE are specified with a load capacitance of 5 pF as in part (d) of Figure 3 on page 6. Transition is measured 500 mV from steady state
voltage.
8. The internal write time of the memory is defined by the overlap of CE LOW, WE LOW, and BHE/BLE LOW. CE, WE, and BHE/BLE must be LOW to initiate a write.
The transition of these signals terminate the write. The input data setup and hold timing is referenced to the leading edge of the signal that terminates the write.
9. The minimum Write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
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