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OS-68338 Datasheet(PDF) 4 Page - Vectron International, Inc
VECTRON [Vectron International, Inc]
OS-68338 Datasheet(HTML) 4 Page - Vectron International, Inc
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in accordance with MIL-PRF-38534, as a minimum. Tabulated records are provided as a part
of the deliverable data package. Devices are handled in accordance with MIL-STD-1686 for
Class 1 devices.
Inspection. The inspection requirements of MIL-PRF-55310 apply to all devices delivered to
this document. Inspection conditions and standards are documented in accordance with the
Quality Assurance, ISO-9001 derived, System of QSP-90100.
Test. The Screening test matrix of Table 5 is tailored for selectable-combination testing to
eliminate costs associated with the development/maintenance of device-specific documentation
packages while maintaining performance integrity.
Marking. Device marking shall be in accordance with the requirements of MIL-PRF-55310.
Ruggedized COTS Design Implementation. Design Pedigree “D” devices (see ¶ 5.2) use the
same robust designs found in the other device pedigrees. They do not include the provisions of
traceability or the Class-qualified componentry noted in paragraphs 3.4.3 and 4.1.
Crystals. Cultured quartz crystal resonators are used to provide the selected frequency for the
devices. The optional use of Premium Q swept quartz can, because of its processing to remove
impurities, be specified for better frequency aging characteristics. In accordance with MIL-
PRF-55310, the manufacturer has a documented crystal element evaluation program.
Passive Components. Established Reliability (ER) failure level R minimum passive
components are procured from QPL suppliers. Lot evaluations are in accordance with MIL-
PRF-55310 or Enhanced Element Evaluation as specified in Table 7.
Class S Microcircuits. Microcircuits are procured from wafer lots that have passed MIL-PRF-
55310 Lot Acceptance Tests for Class S devices. The prescribed die carries a Class 2 ESDS
classification in accordance with MIL-PRF-38535. When optionally specified, further testing
in accordance with MIL-PRF-55310 and MIL-PRF-38534 is performed for radiation hardness
assurance and for Enhanced Element Evaluation as specified in Table 6. Those microcircuits,
identified by a unique part number, are certified for 100krad(Si) total ionizing dose (TID),
RHA level R (2X minimum margin). NSC, as the original 54ACT designer, rates the SEU
LET at >40 MeV and SEL at >120MeV for the FACT™ family (AN-932). Vectron has
conducted additional SEE testing in 2008 to verify this performance since our lot wafer testing
does not include these parameters and determinations.
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