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LA2000 Datasheet(PDF) 4 Page - Sanyo Semicon Device |
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LA2000 Datasheet(HTML) 4 Page - Sanyo Semicon Device |
4 / 8 page Test Circuit Test Conditions Test items Symbol SW-1 SW-2 SW-3 SW-4 Conditions Circuit current ICC 1113 Measure current flowing into pin 9 at VIN = –45 dB Output transistor saturation voltage VCE (sat) 2223 Measure VIN at pin 6 Output diode forward voltage VF 2421 Measure VIN at pin 6 Output-off level in input equivalent VIN 1113 Input level (V.V) when pin 6 turns over Comparator-on level VH 2313 Measure V3 When pin 6 turns over Comparator-off level VL 2313 Measure V3 When pin 6 turns over Pin 8 high level Vp-8 2413 Measure V2 at pin 8 Output transistor leakage current ITL 2433 Measure M3 Output diode leakage current IDL 2442 Measure M2 Equivalent Circuit Block Diagram Unit (resistance: Ω, capacitance: F) LA2000 No.982-4/8 |
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