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C114C-K-G Datasheet(PDF) 7 Page - Kemet Corporation

Part No. C114C-K-G
Description  MULTILAYER CERAMIC CAPACITORS/AXIAL & RADIAL LEADED
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Maker  KEMET [Kemet Corporation]
Homepage  http://www.kemet.com
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C114C-K-G Datasheet(HTML) 7 Page - Kemet Corporation

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© KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300
10
CERAMIC CONFORMALLY COATED/AXIAL
“AXIMAX”
GENERAL SPECIFICATIONS
Working Voltage:
Axial (WVDC)
C0G
50, 100, 200
X7R
25, 50, 100, 200, 250
Z5U
50, 100
Radial (WVDC)
C0G
50, 100, 200, 500, 1k, 1.5k, 2k, 2.5k, 3k
X7R
25, 50, 100, 200, 250, 500, 1k, 1.5k, 2k, 2.5k, 3k
Z5U
50, 100
Temperature Characteristics:
C0G
0 ±30 PPM / °C from -55°C to +125°C (1)
X7R
± 15% from -55°C to +125°C
Z5U
+ 22%, -56% from +10°C to +85°C
Capacitance Tolerance:
C0G
±0.5pF, ±1%, ±2%, ±5%, ±10%, ±20%
X7R
±10%, ±20%, +80% / -20%
Z5U
±20%, 80% / -20%
Construction:
Epoxy encapsulated – meets flame test requirements
of UL Standard 94V-0.
High-temperature solder – meets EIA RS-198, Method 302,
Condition B (260°C for 10 seconds)
Lead Material:
Standard: 100% matte tin (Sn) with nickel (Ni) underplate
and steel core ( “TA” designation).
Alternative 1: 60% Tin (Sn)/40% Lead (Pb) finish with copper-
clad steel core ( “HA” designation).
Alternative 2: 60% Tin (Sn)/40% Lead (Pb) finish with 100%
copper core (available with “HA” termination code with c-spec)
Solderability:
EIA RS-198, Method 301, Solder Temperature: 230°C ±5°C.
Dwell time in solder = 7 ±
seconds.
Terminal Strength:
EIA RS-198, Method 303, Condition A (2.2kg)
ELECTRICAL
Capacitance @ 25°C:
Within specified tolerance and following test conditions.
C0G – >1000pF with 1.0 vrms @ 1 kHz
1000pF with 1.0 vrms @ 1 MHz
X7R – with 1.0 vrms @ 1 kHz (Referee Time: 1,000 hours)
Z5U – with 1.0 vrms @ 1 kHz
Dissipation Factor @25°C:
Same test conditions as capacitance.
C0G – 0.10% maximum
X7R – 2.5% maximum (3.5% for 25V)
Z5U – 4.0% maximum
Insulation Resistance @25°C:
EIA RS-198, Method 104, Condition A <1kV
C0G – 100 G or 1000 M – F, whichever is less.
500V test @ rated voltage, >500V test @ 500V
X7R – 100 G or 1000 M – F, whichever is less.
500V test @ rated voltage, >500V test @ 500V
Z5U – 10 G or 1000 M – F, whichever is less.
Dielectric Withstanding Voltage:
EIA RS-198, Method 103
250V test @ 250% of rated voltage for 5 seconds
with current limited to 50mA.
500V test @ 150% of rated voltage for 5 seconds
with current limited to 50mA.
1000V test @ 120% of rated voltage for 5 seconds
with current limited to 50mA.
ENVIRONMENTAL
Vibration:
with current limited to 50mA.
ENVIRONMENTAL
Vibration:
EIA RS-198, Method 304, Condition D (10-2000Hz; 20g)
Shock:
EIA RS-198, Method 305, Condition I (100g)
Life Test:
EIA RS-198, Method 201, Condition D.
<200V
C0G – 200% of rated voltage @ +125°C
X7R – 200% of rated voltage @ +125°C
Z5U – 200% of rated voltage @ +85°C
>500V
C0G – rated voltage @ +125°C
X7R – rated voltage @ +125°C
Post Test Limits @ 25°C are:
Capacitance Change:
C0G ( 200V) – ±3% or 0.25pF, whichever is greater.
C0G ( 500V) – ±3% or 0.50pF, whichever is greater.
X7R – ± 20% of initial value (2)
Z5U – ± 30% of initial value (2)
Dissipation Factor:
C0G – 0.10% maximum
X7R – 2.5% maximum (3.5% for 25V)
Z5U – 4.0% maximum
Insulation Resistance:
C0G – 10 G or 100 M – F, whichever is less.
>1kV tested @ 500V.
X7R – 10 G or 100 M – F, whichever is less.
>1kV tested @ 500V.
Z5U – 1 G or 100 M – F, whichever is less.
Moisture Resistance:
EIA RS-198, Method 204, Condition A (10 cycles
without applied voltage).
Post Test Limits @ 25°C are:
Capacitance Change:
C0G ( 200V) – ±3% or ±0.25pF, whichever is greater.
C0G ( 500V) – ±3% or ± 0.50pF, whichever is greater.
X7R – ± 20% of initial value (2)
Z5U – ± 30% of initial value (2)
Dissipation Factor:
C0G – 0.10% maximum
X7R – 2.5% maximum (3.5% for 25V)
Z5U – 4.0% maximum
Insulation Resistance:
C0G – 10 G or 100 M – Fwhichever is less.
500V test @ rated voltage, >500V test @ 500V.
X7R – 10 G or 100 M – F, whichever is less.
500V test @ rated voltage, >500V test @ 500V.
Z5U – 1k M or 100 M – F, whichever is less.
Thermal Shock:
EIA RS-198, Method 202, Condition B (C0G & X7R:
-55°C to 125°C); Condition A (Z5U: -55°C to 85°C)
(1) +53 PPM -30 PPM/ °C from +25°C to -55°C, + 60 PPM below 10pF.
(2) X7R and Z5U dielectrics exhibit aging characteristics; therefore, it is highly
recommended that capacitors be deaged for 2 hours at 150°C and stabilized
at room temperature for 48 hours before capacitance measurements are made.


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