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L38C Datasheet(PDF) 51 Page - Renesas Technology Corp |
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L38C Datasheet(HTML) 51 Page - Renesas Technology Corp |
51 / 75 page R8C/L35C Group, R8C/L36C Group, R8C/L38C Group, R8C/L3AC Group 5. Electrical Characteristics REJ03B0293-0100 Rev.1.00 Page 51 of 72 Jun 25, 2010 Notes: 1. Definition of programming/erasure endurance The programming and erasure endurance is defined on a per-block basis. If the programming and erasure endurance is n (n = 10,000), each block can be erased n times. For example, if 1,024 1-byte writes are performed to different addresses in block A, a 1 Kbyte block, and then the block is erased, the programming/erasure endurance still stands at one. However, the same address must not be programmed more than once per erase operation (overwriting prohibited). 2. Endurance to guarantee all electrical characteristics after program and erase. (1 to Min. value can be guaranteed). 3. In a system that executes multiple programming operations, the actual erasure count can be reduced by writing to sequential addresses in turn so that as much of the block as possible is used up before performing an erase operation. For example, when programming groups of 16 bytes, the effective number of rewrites can be minimized by programming up to 128 groups before erasing them all in one operation. In addition, averaging the erasure endurance between blocks A to D can further reduce the actual erasure endurance. It is also advisable to retain data on the erasure endurance of each block and limit the number of erase operations to a certain number. 4. If an error occurs during block erase, attempt to execute the clear status register command, then execute the block erase command at least three times until the erase error does not occur. 5. Customers desiring program/erase failure rate information should contact their Renesas technical support representative. 6. −40°C for D version. 7. The data hold time includes time that the power supply is off or the clock is not supplied. Figure 5.2 Time delay until Suspend Table 5.7 Flash Memory (Data flash Block A to Block D) Characteristics (VCC = 2.7 to 5.5 V and Topr = −20 to 85°C (N version) / −40 to 85°C (D version), unless otherwise specified.) Symbol Parameter Conditions Standard Unit Min. Typ. Max. — Program/erase endurance (1) 10,000 (2) —— times — Byte program time (program/erase endurance ≤ 1,000 times) — 160 1500 µs — Byte program time (program/erase endurance > 1,000 times) — 300 1500 µs — Block erase time (program/erase endurance ≤ 1,000 times) —0.2 1 s — Block erase time (program/erase endurance > 1,000 times) —0.3 1 s td(SR-SUS) Time delay from suspend request until suspend — — 5 + CPU clock × 3 cycles ms — Interval from erase start/restart until following suspend request 0— — ms — Time from suspend until erase restart — — 30+CPU clock × 1 cycle µs td(CMDRST- READY) Time from when command is forcibly terminated until reading is enabled — — 30+CPU clock × 1 cycle µs — Program, erase voltage 2.7 — 5.5 V — Read voltage 1.8 — 5.5 V — Program, erase temperature −20 (6) —85 °C — Data hold time (7) Ambient temperature = 55 °C 20 — — year FST6 bit Suspend request (FMR21 bit) Fixed time Clock-dependent time Access restart FST6, FST7: Bit in FST register FMR21: Bit in FMR2 register FST7 bit td(SR-SUS) |
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