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SN74AUP1G00DBVTG4 Datasheet(PDF) 1 Page - Texas Instruments

Part # SN74AUP1G00DBVTG4
Description  LOW-POWER SINGLE 2-INPUT POSITIVE-NAND GATE
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

SN74AUP1G00DBVTG4 Datasheet(HTML) 1 Page - Texas Instruments

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DNU – Do not use
N.C. – No internal connection
See mechanical drawings for dimensions.
YZP PACKAGE
(TOP VIEW)
YFP PACKAGE
(
VIEW)
TOP
DBV PACKAGE
(TOP VIEW)
5
1
2
VCC
Y
4
3
A
B
GND
DCK PACKAGE
(TOP VIEW)
5
1
2
VCC
Y
4
3
A
B
GND
DRL PACKAGE
(TOP VIEW)
5
1
2
VCC
Y
4
3
A
B
GND
DRY PACKAGE
(TOP VIEW)
B
N.C.
A
6
5
4
2
3
GND
Y
VCC
1
GND
Y
3
4
B
2
5
A
6
1
N.C.
VCC
DSF PACKAGE
(TOP VIEW)
GND
A
Y
V
CC
B
3
5
2
1
4
A1
B1
C1
A2
C2
GND
A
Y
V
CC
B
3
6
2
1
4
5
DNU
A1
B1
C1
A2
B2
C2
SN74AUP1G00
www.ti.com
SCES604G – SEPTEMBER 2004 – REVISED MARCH 2010
LOW-POWER SINGLE 2-INPUT POSITIVE-NAND GATE
Check for Samples: SN74AUP1G00
1
FEATURES
Available in the Texas Instruments NanoStar™
Wide Operating VCC Range of 0.8 V to 3.6 V
Package
Optimized for 3.3-V Operation
Low Static-Power Consumption
3.6-V I/O Tolerant to Support Mixed-Mode
(ICC = 0.9 mA Max)
Signal Operation
Low Dynamic-Power Consumption
tpd = 4.8 ns Max at 3.3 V
(Cpd = 4 pF Typ at 3.3 V)
Suitable for Point-to-Point Applications
Low Input Capacitance (Ci = 1.5 pF Typ)
Latch-Up Performance Exceeds 100 mA Per
Low Noise Overshoot and Undershoot
JESD 78, Class II
<10% of VCC
ESD Performance Tested Per JESD 22
Ioff Supports Partial-Power-Down Mode
2000-V Human-Body Model
Operation
(A114-B, Class II)
Input Hysteresis Allows Slow Input Transition
1000-V Charged-Device Model (C101)
and Better Switching Noise Immunity at Input
(Vhys = 250 mV Typ at 3.3 V)
DESCRIPTION/ORDERING INFORMATION
The AUP family is TI's premier solution to the industry's low-power needs in battery-powered portable
applications. This family ensures a very low static and dynamic power consumption across the entire VCC range
of 0.8 V to 3.6 V, resulting in an increased battery life. This product also maintains excellent signal integrity (see
Figure 1 and Figure 2).
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2004–2010, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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