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S5T3170X01 Datasheet(PDF) 5 Page - Samsung semiconductor |
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S5T3170X01 Datasheet(HTML) 5 Page - Samsung semiconductor |
5 / 10 page LOW POWER DTMF RECEIVER S5T3170 5 NOTES: 1. Digit sequence consists of all 16 DTMF tones. 2. Tone duration = 40mS, Tone pause = 40mS. 3. Nominal DTMF frequencies are used. 4. Both tones in the composite signal have an equal amplitude. 5. Tone pair is deviated by ± 1.5% ± 2Hz. 6. Bandwidth limited (3KHz) Gaussian Noise. 7. The precise dial tone frequencies are (350Hz and 440Hz) ± 2%. 8. For an error rate of better than 1 in 10000. 9. Referenced to lowest level frequency component in DTMF signal. 10. Minimum signal acceptance level is measured with specified maximum frequency deviation. 11. This item also applies to a third tone injected onto the power supply. 12. Referenced to Fig. 1 Input DTMF tone level at -28dBm. Third Tone Tolerance T3rd − −25 −16 − dB Noise Tolerance TN − − −12 − dB Dial Tone Tolerance DT − 18 22 − dB Crystal Clock Frequency fCK − 3.5759 3.5795 3.5831 MHz Maximum Clock Input Rise Time tR(MAX) External Clock − − 110 nS Maximum Clock Input Fall Time tF(MAX) External Clock − − 110 nS Acceptable Clock Input Duty Cycle DCK External Clock 40 50 60 % Acceptable Capacitive Load DL OSC2 PIN − − 30 pF Tone Present Detect Time tDET(P) − 5 11 14 mS Tone Absent Detect Time tDET(A) − 0.5 4 8.5 mS Minimum Tone Duration Accept tTDA(MIN) User Adjustable − − 40 mS Minimum Tone Duration Reject tTDR(MAX) User Adjustable 20 − − mS Acceptable Interdigit Pause tIDP(A) User Adjustable − − 40 mS Rejectable Interdigit Pause tIDP(R) User Adjustable 20 − − mS Propagation Delay Time SI to Q tD(SI-Q) OE = High − 8 11 µS Propagation Delay Time SI to DSO tD(SI-D) OE = High − 12 16 µS Output Data Setup Q to DSO tSU OE = High − 3.4 − µS Propagation Delay Time OE to Q (Enable) tD(QE-Q)EN RL = 10K, CL = 50pF − 50 60 nS Propagation Delay Time OE to Q (Disable) tD(QE-Q)DIS RL = 10K, CL = 50pF − 300 − nS ELECTRICAL CHARACTERISTICS (Continued) (VDD = 5V, Ta = 25°C, unless otherwise noted) Characteristic Symbol Test Conditions Min. Typ. Max. Unit |
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