K9F2808U0M-YCB0, K9F2808U0M-YIB0

FLASH MEMORY

5

PIN DESCRIPTION

Command Latch Enable(CLE)

The CLE input controls the path activation for commands sent to the command register. When active high, commands are latched

into the command register through the I/O ports on the rising edge of the WE signal.

Address Latch Enable(ALE)

The ALE input controls the activating path for address to the internal address registers. Addresses are latched on the rising edge of

WE with ALE high.

Chip Enable(CE)

The CE input is the device selection control. When CE goes high during a read operation the device is returned to standby mode.

However, when the device is in the busy state during program or erase, CE high is ignored, and does not return the device to

standby mode.

Write Enable(WE)

The WE input controls writes to the I/O port. Commands, address and data are latched on the rising edge of the WE pulse.

Read Enable(RE)

The RE input is the serial data-out control, and when active drives the data onto the I/O bus. Data is valid tREA after the falling edge

of RE which also increments the internal column address counter by one.

Spare Area Enable(SE)

The SE input controls the access of the spare area. When SE is high, the spare area is not accessible for reading or programming.

SE is recommended to be coupled to GND or Vcc and should not be toggled during reading or programming.

I/O Port : I/O 0 ~ I/O 7

The I/O pins are used to input command, address and data, and to output data during read operations. The I/O pins float to high-z

when the chip is deselected or when the outputs are disabled.

Write Protect(WP)

The WP pin provides inadvertent write/erase protection during power transitions. The internal high voltage generator is reset when

the WP pin is active low.

Ready/Busy(R/B)

The R/B output indicates the status of the device operation. When low, it indicates that a program, erase or random read operation is

in process and returns to high state upon completion. It is an open drain output and does not float to high-z condition when the chip

is deselected or when outputs are disabled.