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SSTV16859BS Datasheet(PDF) 8 Page - NXP Semiconductors |
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SSTV16859BS Datasheet(HTML) 8 Page - NXP Semiconductors |
8 / 14 page Philips Semiconductors Product data SSTV16859 2.5 V 13-bit to 26-bit SSTL_2 registered buffer for stacked DDR DIMM 2002 Feb 19 8 TIMING REQUIREMENTS Over recommended operating conditions; Tamb = 0 to +70 °C (unless otherwise noted) (see Figure 1) LIMITS SYMBOL PARAMETER TEST CONDITIONS VDD = 2.5 V ±0.2 V UNIT MIN MAX fclock Clock frequency — 200 MHz tw Pulse duration, CK, CK HIGH or LOW 2.5 — ns tact Differential inputs active time Notes 1, 2 — 22 ns tinact Differential inputs inactive time Notes 1, 3 — 22 ns t Setup time, fast slew rate (see Notes 4 and 6) Data before CK ↑ CK↓ 0.75 ns tsu Setup time, slow slew rate (see Notes 5 and 6) Data before CK ↑, CK↓ 0.9 ns t Hold time, fast slew rate (see Notes 4 and 6) Data after CK ↑ CK↓ 0.75 ns th Hold time, slow slew rate (see Notes 5 and 6) Data after CK ↑, CK↓ 0.9 ns tSL Output slew 1 6 V/ns NOTES: 1. This parameter is not necessarily production tested. 2. Data inputs must be below a minimum time of tact max, after RESET is taken high. 3. Data and clock inputs must be held at valid levels (not floating) a minimum time of tinact max, after RESET is taken low. 4. For data signal input slew rate ≥ 1 V/ns. 5. For data signal input slew rate ≥ 0.5 V/ns and < 1 V/ns. 6. CK, CK signals input slew rates are ≥ 1 V/ns. SWITCHING CHARACTERISTICS Over recommended operating conditions; Tamb = 0 to +70 °C; VDD = 2.3 – 2.7 V. Class I, VREF = VTT = VDD × 0.5 and CL = 10 pF (unless otherwise noted) (see Figure 1) O O LIMITS SYMBOL FROM (INPUT) TO (OUTPUT) VDD = 2.5 V ±0.2 V UNIT (INPUT) (OUTPUT) MIN MAX fmax 200 — MHz tpd CK and CK Q 1.1 2.8 ns tPHL RESET Q 1.1 5 ns |
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