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CAT28C17AGI-20T Datasheet(PDF) 5 Page - ON Semiconductor |
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CAT28C17AGI-20T Datasheet(HTML) 5 Page - ON Semiconductor |
5 / 12 page CAT28C17A http://onsemi.com 5 Figure 2. A.C. Testing Input/Output Waveform (Note 10) INPUT PULSE LEVELS REFERENCE POINTS 2.0 V 0.8 V 2.4 V 0.45 V 10.Input rise and fall times (10% and 90%) < 10 ns. Figure 3. A.C. Testing Load Circuit (example) 1.3 V DEVICE UNDER TEST 1N914 3.3 K OUT CL = 100 pF CL INCLUDES JIG CAPACITANCE Table 7. A.C. CHARACTERISTICS, WRITE CYCLE (VCC = 5 V ±10%, unless otherwise specified.) Symbol Parameter 28C17A−20 Units Min Max tWC Write Cycle Time 10 ms tAS Address Setup Time 10 ns tAH Address Hold Time 100 ns tCS CE Setup Time 0 ns tCH CE Hold Time 0 ns tCW (Note 11) CE Pulse Time 150 ns tOES OE Setup Time 15 ns tOEH OE Hold Time 15 ns tWP (Note 11) WE Pulse Width 150 ns tDS Data Setup Time 50 ns tDH Data Hold Time 10 ns tDL Data Latch Time 50 ns tINIT (Note 12) Write Inhibit Period After Power−up 5 20 ms tDB Time to Device Busy 80 ns 11. A write pulse of less than 20 ns duration will not initiate a write cycle. 12.This parameter is tested initially and after a design or process change that affects the parameter. |
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