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ADM1024ARUZ Datasheet(PDF) 5 Page - ON Semiconductor

Part No. ADM1024ARUZ
Description  System Hardware Monitor with Remote Diode Thermal Sensing
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Maker  ONSEMI [ON Semiconductor]
Homepage  http://www.onsemi.com
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ADM1024ARUZ Datasheet(HTML) 5 Page - ON Semiconductor

 
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ADM1024
http://onsemi.com
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ELECTRICAL CHARACTERISTICS TA = TMIN to TMAX, VCC = VMIN to VMAX, unless otherwise noted. (Note 1 and 2)
Parameter
Unit
Max
Typ
Min
Test Conditions/Comments
OPEN−DRAIN SERIAL DATABUS OUTPUT (SDA)
Output Low Voltage, VOL
IOUT = −3.0 mA, VCC = 2.85 V −3.60 V
0.4
V
High Level Output Leakage Current, IOH
VOUT = VCC
0.1
100
mA
SERIAL BUS DIGITAL INPUTS (SCL, SDA)
Input High Voltage, VIH
2.2
V
Input Low Voltage, VIL
0.8
V
Hysteresis
500
mV
Glitch Immunity
100
ns
DIGITAL INPUT LOGIC LEVELS (ADD, CI, RESET, VID0−VID4, FAN1, FAN2) (Note 7)
Input High Voltage, VIH
VCC = 2.85 V − 5.5 V
2.2
V
Input Low Voltage, VIL
VCC = 2.85 V − 5.5 V
0.8
V
NTEST_IN
Input High Current, IIH
VCC = 2.85 V − 5.5 V
2.2
V
DIGITAL INPUT CURRENT
Input High Current, IIH
VIN = VCC
–1.0
mA
Input Low Current, IIL
VIN = 0
1.0
mA
Input Capacitance, CIN
20
pF
SERIAL BUS TIMING (Note 8)
Clock Frequency, fSCLK
See Figure 2
400
kHz
Glitch Immunity, tSW
See Figure 2
50
ns
Bus Free Time, tBUF
See Figure 2
1.3
ms
Start Setup Time, tSU; STA
See Figure 2
600
ns
Start Hold Time, tHD; STA
See Figure 2
600
ns
SCL Low Time, tLOW
See Figure 2
1.3
ms
SCL High Time, tHIGH
See Figure 2
0.6
ms
SCL, SDA Rise Time, tr
See Figure 2
300
ns
SCL, SDA Fall Time, tf
See Figure 2
300
ms
Data Setup Time, tSU; DAT
See Figure 2
100
ns
Data Hold Time, tHD; DAT
See Figure 2
900
ns
1. All voltages are measured with respect to GND, unless otherwise specified.
2. Typicals are at TA = 25°C and represent the most likely parametric norm. Shutdown current typ is measured with VCC = 3.3V.
3. TUE (Total Unadjusted Error) includes Offset, Gain, and Linearity errors of the ADC, multiplexer, and on−chip input attenuators, including
an external series input protection resistor value between 0 kW and 1 kW.
4. Total monitoring cycle time is nominally m × 755 ms + n × 33244 ms, where m is the number of channels configured as analog inputs, plus 2
for the internal VCC measurement and internal temperature sensor, and n is the number of channels configured as external temperature
channels (D1 and D2).
5. The total fan count is based on two pulses per revolution of the fan tachometer output.
6. Open−drain digital outputs may have an external pullup resistor connected to a voltage lower or higher than VCC (up to 6.5 V absolute maximum).
7. All logic inputs except ADD are tolerant of 5.0 V logic levels, even if VCC is less than 5.0 V. ADD is a three−state input that may be connected
to VCC, GND, or left open−circuit.
8. Timing specifications are tested at logic levels of VIL = 0.8 V for a falling edge and VIH = 2.2 V for a rising edge.
Figure 2. Serial Bus Timing Diagram
P
S
PS
SCL
SDA
tR
tF
tLOW
tHD:STA
tHD:DAT
tHIGH
tSU:DAT
tSU:STA
tHD:STA
tSU:STO
tBUF


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