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CDCV304 Datasheet(PDF) 1 Page - Texas Instruments

Part # CDCV304
Description  200-MHz GENERAL-PURPOSE CLOCK BUFFER, PCI-X COMPLIANT
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

CDCV304 Datasheet(HTML) 1 Page - Texas Instruments

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1
FEATURES
1
2
3
4
8
7
6
5
CLKIN
OE
1Y0
GND
1Y3
1Y2
VDD
1Y1
TSSOP
PW PACKAGE
(TOP VIEW)
DESCRIPTION
3
5
7
8
1Y0
1Y1
1Y2
1Y3
Logic
Control
2
1
OE
CLKIN
CDCV304
www.ti.com................................................................................................................................................ SCAS643F – SEPTEMBER 2000 – REVISED APRIL 2009
200-MHz GENERAL-PURPOSE CLOCK BUFFER, PCI-X COMPLIANT
• General-Purpose and PCI-X 1:4 Clock Buffer
• Operating Frequency
0 MHz to 200 MHz General-Purpose
• Low Output Skew: <100 ps
• Distributes One Clock Input to One Bank of
Four Outputs
• Output Enable Control that Drives Outputs
Low when OE is Low
• Operates from Single 3.3-V Supply or 2.5-V
Supply
• PCI-X Compliant
• 8-Pin TSSOP Package
The CDCV304 is a high-performance, low-skew, general-purpose PCI-X compliant clock buffer. It distributes one
input clock signal (CLKIN) to the output clocks (1Y[0:3]). It is specifically designed for use with PCI-X
applications. The CDCV304 operates at 3.3 V and 2.5 V and is therefore compliant to the 3.3-V PCI-X
specifications.
The CDCV304 is characterized for operation from –40°C to 85°C for automotive and industrial applications.
FUNCTIONAL BLOCK DIAGRAM
FUNCTION TABLE
INPUTS
OUTPUTS
CLKIN
OE
1Y[0:3]
L
L
L
H
L
L
L
H
L
H
H
H
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2000–2009, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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